參數(shù)資料
型號(hào): AM29F100T-150FCB
廠商: ADVANCED MICRO DEVICES INC
元件分類(lèi): PROM
英文描述: Quadruple 2-Input Positive-AND Gates 14-SO -40 to 85
中文描述: 128K X 8 FLASH 5V PROM, 150 ns, PDSO48
封裝: REVERSE, TSOP-48
文件頁(yè)數(shù): 6/8頁(yè)
文件大?。?/td> 57K
代理商: AM29F100T-150FCB
6
Am29F100 Known Good Die
S U P P L E M E N T
PRODUCT TEST FLOW
Figure 1 provides an overview of AMD’s Known Good
Die test flow. For more detailed information, refer to the
Am29F100 product qualification database supplement
for KGD. AMD implements quality assurance proce-
dures throughout the product test flow. In addition, an
off-line quality monitoring program (QMP) further guar-
antees AMD quality standards are met on Known Good
Die products. These QA procedures also allow AMD to
produce KGD products without requiring or imple-
menting burn-in.
Figure 1.
AMD KGD Product Test Flow
Wafer Sort 1
Bake
24 hours at 250
°
C
Wafer Sort 2
Wafer Sort 3
High Temperature
Packaging for Shipment
Shipment
DC Parameters
Functionality
Programmability
Erasability
Data Retention
DC Parameters
Functionality
Programmability
Erasability
DC Parameters
Functionality
Programmability
Erasability
Speed
Incoming Inspection
Wafer Saw
Die Separation
100% Visual Inspection
Die Pack
相關(guān)PDF資料
PDF描述
AM29F100T-150FE Quadruple 2-Input Positive-AND Gates 14-TSSOP -40 to 85
AM29F100T-150FEB Quadruple 2-Input Positive-AND Gates 14-TSSOP -40 to 85
AM29F100T-150FI Quadruple 2-Input Positive-AND Gates 14-TSSOP -40 to 85
AM29F100T-150FIB 1 Megabit (128 K x 8-bit/64 K x 16-bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory
AM29F100T-150SC Quadruple 2-Input Positive-AND Gates 14-TSSOP -40 to 85
相關(guān)代理商/技術(shù)參數(shù)
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