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參數(shù)資料
| 型號(hào)： | AM29F016-75EIB |
| 廠商： | Advanced Micro Devices, Inc. |
| 元件分類(lèi)： | 溫度/濕度傳感器 |
| 英文描述： | LM32 Dual Thermal Diode Temperature Sensor with SensorPath™ Bus; Package: TSSOP; No of Pins: 14; Qty per Container: 2500; Container: Reel |
| 中文描述： | 16兆位（2097152 × 8位）的CMOS 5.0伏只，扇區(qū)擦除閃存 |
| 文件頁(yè)數(shù)： | 25/36頁(yè) |
| 文件大小： | 219K |
| 代理商： | AM29F016-75EIB |
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Am29F016
25
AC CHARACTERISTICS
Read-only Operations Characteristics
Notes:
1. Test Conditions (for -75):
Output Load: 1 TTL gate and 30 pF
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level: 1.5 V input and
output
2. Test Conditions (for all others):
Output Load: 1 TTL gate and 100 pF
Input rise and fall times: 20 ns
Input pulse levels: 0.45 V to 2.4 V
Timing measurement reference level: 0.8 V and 2.0 V
input and output
3. Output driver disable time.
4. Not 100% tested.
Parameter Symbol
Parameter Description
Test Setup
Speed Options (Notes 1 and 2)
Unit
JEDEC Standard
-75
-90
-120
-150
t
AVAV
t
RC
Read Cycle Time 4
Min
70
90
120
150
ns
t
AVQV
t
ACC
Address to Output Delay
CE = V
IL
OE = V
IL
Max
70
90
120
150
ns
t
ELQV
t
CE
Chip Enable to Output Delay
OE = V
IL
Max
70
90
120
150
ns
t
GLQV
t
OE
Output Enable to Output Delay
Max
40
40
50
55
ns
t
EHQZ
t
DF
Chip Enable to Output High Z
(Notes 3, 4)
Max
20
20
30
35
ns
t
GHQZ
t
DF
Output Enable to Output High Z
(Notes 3, 4)
Max
20
20
30
35
ns
t
AXQX
t
OH
Output Hold Time From Addresses CE
or
OE Whichever Occurs First
Min
0
0
0
0
ns
t
Ready
RESET Pin Low to Read Mode
4
Max
20
20
20
20
μ
s
18805D-11
Figure 7.
Test Conditions
2.7 k
Diodes = IN3064
or Equivalent
C
L
6.2 k
5.0 Volt
IN3064
or Equivalent
Note:
C
L
(for -75) = 30 pF including jig capacitance
C
L
(for all others) = 100 pF including jig capacitance
Device
Under
Test
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