參數(shù)資料
型號: AM28F256A-90PIB
廠商: Advanced Micro Devices, Inc.
英文描述: 8-Bit Identity/Magnitude Comparators 20-SOIC 0 to 70
中文描述: 256千比特(32畝× 8位)的CMOS 12.0伏,整體擦除閃存的嵌入式記憶算法
文件頁數(shù): 24/35頁
文件大?。?/td> 456K
代理商: AM28F256A-90PIB
24
Am28F256A
SWITCHING TEST WAVEFORMS
SWITCHING CHARACTERISTICS over operating range unless otherwise specified
AC Characteristics—Read Only Operation
Notes:
1. Guaranteed by design not tested.
2. Not 100% tested.
Parameter Symbols
Parameter Description
Am28F256A Speed Options
Unit
JEDEC
Standard
-70
-90
-120
-150
-200
t
AVAV
t
RC
Read Cycle Time (Note 2)
Min
70
90
120
150
200
ns
t
ELQV
t
CE
Chip Enable Access Time
Max
70
90
120
150
200
ns
t
AVQV
t
ACC
Address Access Time
Max
70
90
120
150
200
ns
t
GLQV
t
OE
Output Enable Access Time
Max
35
35
50
55
55
ns
t
ELQX
t
LZ
Chip Enable to Output in Low Z
(Note 2)
Min
0
0
0
0
0
ns
t
EHQZ
t
DF
Chip Disable to Output in High Z
(Note 1)
Max
20
20
30
35
35
ns
t
GLQX
t
OLZ
Output Enable to Output in Low Z
(Note 2)
Min
0
0
0
0
0
ns
t
GHQZ
t
DF
Output Disable to Output in High Z
(Note 2)
Max
20
20
30
35
35
ns
t
AXQX
t
OH
Output Hold from first of Address,
CE
#
, or OE
#
Change (Note 2)
Min
0
0
0
0
0
ns
t
VCS
V
CC
Setup Time to Valid Read
(Note 2)
Min
50
50
50
50
50
μs
18879C-17
3 V
0 V
Input
Output
1.5 V
1.5 V
Test Points
AC Testing for -70 devices: Inputs are driven at 3.0 V for a
logic “1” and 0 V for a logic “0”. Input pulse rise and fall times
are
10 ns.
2.4 V
0.45 V
Input
Output
Test Points
2.0 V
2.0 V
0.8 V
0.8 V
AC Testing (all speed options except -70): Inputs are driven at
2.4 V for a logic “1” and 0.45 V for a logic “0”. Input pulse rise
and fall times are
10 ns.
相關(guān)PDF資料
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