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參數(shù)資料
| 型號(hào)： | AM28F256A-70FC |
| 廠商： | ADVANCED MICRO DEVICES INC |
| 元件分類： | PROM |
| 英文描述： | 256 Kilobit (32 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms |
| 中文描述： | 32K X 8 FLASH 12V PROM, 70 ns, PDSO32 |
| 封裝： | REVERSE, TSOP-32 |
| 文件頁數(shù)： | 24/35頁 |
| 文件大?。?/td> | 456K |
| 代理商： | AM28F256A-70FC |
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24
Am28F256A
SWITCHING TEST WAVEFORMS
SWITCHING CHARACTERISTICS over operating range unless otherwise specified
AC Characteristics—Read Only Operation
Notes:
1. Guaranteed by design not tested.
2. Not 100% tested.
Parameter Symbols
Parameter Description
Am28F256A Speed Options
Unit
JEDEC
Standard
-70
-90
-120
-150
-200
t
AVAV
t
RC
Read Cycle Time (Note 2)
Min
70
90
120
150
200
ns
t
ELQV
t
CE
Chip Enable Access Time
Max
70
90
120
150
200
ns
t
AVQV
t
ACC
Address Access Time
Max
70
90
120
150
200
ns
t
GLQV
t
OE
Output Enable Access Time
Max
35
35
50
55
55
ns
t
ELQX
t
LZ
Chip Enable to Output in Low Z
(Note 2)
Min
0
0
0
0
0
ns
t
EHQZ
t
DF
Chip Disable to Output in High Z
(Note 1)
Max
20
20
30
35
35
ns
t
GLQX
t
OLZ
Output Enable to Output in Low Z
(Note 2)
Min
0
0
0
0
0
ns
t
GHQZ
t
DF
Output Disable to Output in High Z
(Note 2)
Max
20
20
30
35
35
ns
t
AXQX
t
OH
Output Hold from first of Address,
CE
#
, or OE
#
Change (Note 2)
Min
0
0
0
0
0
ns
t
VCS
V
CC
Setup Time to Valid Read
(Note 2)
Min
50
50
50
50
50
μs
18879C-17
3 V
0 V
Input
Output
1.5 V
1.5 V
Test Points
AC Testing for -70 devices: Inputs are driven at 3.0 V for a
logic “1” and 0 V for a logic “0”. Input pulse rise and fall times
are
≤
10 ns.
2.4 V
0.45 V
Input
Output
Test Points
2.0 V
2.0 V
0.8 V
0.8 V
AC Testing (all speed options except -70): Inputs are driven at
2.4 V for a logic “1” and 0.45 V for a logic “0”. Input pulse rise
and fall times are
≤
10 ns.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| AM28F256A-70FCB | 256 Kilobit (32 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms |
| AM28F256A-70FE | 256 Kilobit (32 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms |
| AM28F256A-70FEB | Synchronous 4-Bit Up/Down Binary Counters 16-PDIP 0 to 70 |
| AM28F256A-70FI | 256 Kilobit (32 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms |
| AM28F256A-70FIB | 4-by-4 register files with 3-state outputs 16-SOIC 0 to 70 |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| AM28F256A-70FCB | 制造商:AMD 制造商全稱:Advanced Micro Devices 功能描述:256 Kilobit (32 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms |
| AM28F256A-70FE | 制造商:AMD 制造商全稱:Advanced Micro Devices 功能描述:256 Kilobit (32 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms |
| AM28F256A-70FEB | 制造商:AMD 制造商全稱:Advanced Micro Devices 功能描述:256 Kilobit (32 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms |
| AM28F256A-70FI | 制造商:AMD 制造商全稱:Advanced Micro Devices 功能描述:256 Kilobit (32 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms |
| AM28F256A-70FIB | 制造商:AMD 制造商全稱:Advanced Micro Devices 功能描述:256 Kilobit (32 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms |
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