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3
ALD1000
ALD1000U
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
FREQUENCY RESPONSE
G = 1
G = 5
G = 100
Slew Rate
700
400
50
4
kHz
kHz
kHz
V/
μ
S
V
O
=
±
10V, G = 10
SETTLING TIME, 0.01%
G = 1
G = 5
G = 100
20
20
30
μ
S
μ
S
μ
S
POWER SUPPLY
Quiescent Current
Internal Drive Transistors
5
mA
TEMPERATURE RANGE
Operating
Storage
–40
–65
+85
+150
°
C
°
C
NOTES: (1) Gain drift depends on tempco of 50K factor on gain equation when gain is greater than 1. (2) External Drive capacity varies with configuration. See
Application Note.
ABSOLUTE MAXIMUM RATINGS
Supply Voltage (
±
V
S
).............................................................. +25V, –18V
IA Inputs ............................................................................................
±
40V
SWOP Inputs .......................................................................................
±
V
S
Logic Inputs .................................................................... +V
, –V
+ 0.5V
Junction Temperature...................................................................... 150
°
C
Storage Temperature..................................................... –65
°
C to +150
°
C
Lead Temperature (soldering, 10s)............................................... +300
°
C
Output Short-to-Ground at 25
°
C ............................................. Continuous
SPECIFICATIONS
(CONT)
At +V
S
= 24V, –V
S
= 15V, T
AMB
= 25
°
C, and 2N2222, 2N2907 external transistors, unless otherwise noted.
The information provided herein is believed to be reliable; however, BURR-BROWN assumes no responsibility for inaccuracies or omissions. BURR-BROWN assumes
no responsibility for the use of this information, and all use of such information shall be entirely at the user’s own risk. Prices and specifications are subject to change
without notice. No patent rights or licenses to any of the circuits described herein are implied or granted to any third party. BURR-BROWN does not authorize or warrant
any BURR-BROWN product for use in life support devices and/or systems.
PACKAGE/ORDERING INFORMATION
PACKAGE DRAWING
NUMBER
(1)
PRODUCT
PACKAGE
ALD1000U
28-Pin SOIC
217
NOTE: (1) For detailed drawing and dimension table, please see end of data
sheet, or Appendix C of Burr-Brown IC Data Book.
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Burr-Brown
recommends that all integrated circuits be handled with ap-
propriate precautions. Failure to observe proper handling and
installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.