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參數(shù)資料
| 型號(hào)： | ADT14GS-REEL |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 溫度/濕度傳感器 |
| 英文描述： | ANALOG TEMP SENSOR-VOLTAGE, 2.49-2.52V, 3Cel, RECTANGULAR, SURFACE MOUNT |
| 封裝： | SOIC-16 |
| 文件頁(yè)數(shù)： | 10/16頁(yè) |
| 文件大?。?/td> | 346K |
| 代理商： | ADT14GS-REEL |
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ADT14
–3–
REV. 0
WAFER TEST LIMITS
Parameter
Symbol
Conditions
Min
Typ
Max
Units
INPUTS SET HIGH, SET LOW
Input Bias Current
IB
70
nA
OUTPUT VPTAT
Temperature Accuracy
TA = +25
°C, No Load
1.5
°C
OUTPUT VREF
Nominal Value
VREF
TA = +25°C, No Load
2.490
2.510
V
Line Regulation
4.5 V
≤ V ≤ 13.2 V
±0.08
%/V
Load Regulation
10
A ≤ IV
REF
≤ 500 A
±0.25
%/mA
OPEN-COLLECTOR OUTPUTS OVER, UNDER
Output Low Voltage
VOL
ISINK = 1.6 mA
0.4
V
Output Leakage Current
IOH
100
A
POWER SUPPLY
Supply Range
V+
4.5
5.5
V
Supply Current
ISY
Unloaded
600
A
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly and nominal yield loss, yield after packaging is not guaranteed for
standard product dice. Consult factory to negotiate specifications based on lot qualification through sample lot assembly and testing.
DICE CHARACTERISTICS
Die Size 0.069
× 0.080 inch, 5520 sq. mils
(1.75
× 2.03 mm, 3.55 sq. mm)
Transistor Count: 130
(V+ = +5 V, GND = 0 V, TA = +25 C unless otherwise noted)
WARNING!
ESD SENSITIVE DEVICE
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the ADT14 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
OBSOLETE
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