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參數(shù)資料
| 型號： | AD9747BCPZRL |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 9/28頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC DAC DUAL 16B 250MSPS 72-LFCSP |
| 產(chǎn)品培訓(xùn)模塊： | Data Converter Fundamentals DAC Architectures |
| 標(biāo)準(zhǔn)包裝： | 2,000 |
| 位數(shù)： | 16 |
| 數(shù)據(jù)接口： | 并聯(lián) |
| 轉(zhuǎn)換器數(shù)目： | 2 |
| 電壓電源： | 模擬和數(shù)字 |
| 功率耗散（最大）： | 345mW |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 72-VFQFN 裸露焊盤，CSP |
| 供應(yīng)商設(shè)備封裝： | 72-LFCSP |
| 包裝： | 帶卷 (TR) |
| 輸出數(shù)目和類型： | 4 電流，單極 |
| 采樣率（每秒）： | 250M |
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Data Sheet
AD9741/AD9743/AD9745/AD9746/AD9747
Rev. A | Page 17 of 28
TERMINOLOGY
Integral Nonlinearity (INL)
The maximum deviation of the actual analog output from the
ideal output, as determined by a straight line drawn from zero
scale to full scale.
Differential Nonlinearity (DNL)
A measure of the maximum deviation in analog output associated
with any single value change in the digital input code relative to
an ideal LSB.
Monotonicity
A DAC is monotonic if the analog output increases or remains
constant in response to an increase in the digital input.
Offset Error
The deviation of the output current from the ideal zero-scale
current. For differential outputs, 0 mA is expected at IOUTP when
all inputs are low, and 0 mA is expected at IOUTN when all inputs
are high.
Gain Error
The deviation of the output current from the ideal full-scale
current. Actual full-scale output current is determined by
subtracting the output (when all inputs are low) from the
output (when all inputs are high).
Output Compliance Range
The range of allowable voltage seen by the analog output of a
current output DAC. Operation beyond the compliance limits
may cause output stage saturation and/or a breakdown resulting
in nonlinear performance.
Temperature Drift
Temperature drift is specified as the maximum change in a
parameter from ambient temperature (25°C) to either TMIN
or TMAX and is typically reported as ppm/°C.
Spurious-Free Dynamic Range (SFDR)
The difference in decibels between the peak amplitude of a test
tone and the peak amplitude of the largest spurious signal over
the specified bandwidth.
Intermodulation Distortion (IMD)
The difference in decibels between the maximum peak ampli-
tude of two test tones and the maximum peak amplitude of
the distortion products created from the sum or difference of
integer multiples of the test tones.
Adjacent Channel Leakage Ratio (ACLR)
The ratio between the measured power of a wideband signal
within a channel relative to the measured power in an empty
adjacent channel.
Noise Spectral Density (NSD)
The measured noise power over a 1 Hz bandwidth seen at the
analog output.
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