參數(shù)資料
型號: AD9257BCPZ-65
廠商: Analog Devices Inc
文件頁數(shù): 20/40頁
文件大?。?/td> 0K
描述: IC ADC 14BIT SRL 65MSPS 64LFCSP
標(biāo)準(zhǔn)包裝: 1
位數(shù): 14
采樣率(每秒): 65M
數(shù)據(jù)接口: 串行,SPI?
轉(zhuǎn)換器數(shù)目: 8
功率耗散(最大): 547mW
電壓電源: 模擬和數(shù)字
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 64-VFQFN 裸露焊盤,CSP
供應(yīng)商設(shè)備封裝: 64-LFCSP-VQ(9x9)
包裝: 托盤
輸入數(shù)目和類型: 8 個差分
Data Sheet
AD9257
Rev. A | Page 27 of 40
BUILT-IN OUTPUT TEST MODES
The AD9257 includes a built-in test feature designed to enable
verification of the integrity of each data output channel, as well
as to facilitate board level debugging. Various output test options
are provided to place predictable values on the outputs of the
OUTPUT TEST MODES
The output test options are described in Table 17 at Address 0x0D.
When an output test mode is enabled, the analog section of the
ADC is disconnected from the digital back-end blocks and the
test pattern is run through the output formatting block. Some of
the test patterns are subject to output formatting, and some are
not. The PN generators from the PN sequence tests can be reset
by setting Bit 4 or Bit 5 of Register 0x0D. These tests can be
performed with or without an analog signal (if present, the
analog signal is ignored), but they do require an encode clock.
For more information, see the AN-877 Application Note,
Interfacing to High Speed ADCs via SPI.
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