
Test
Level Min
AD9026AD
Typ
AD9026BD
Min
Typ
AD9027AD
Min
Typ Max
AD9027BD
Min Typ Max Units
Parameter (Conditions)
AC ACCURACY
Differential Nonlinearity
Temp
Max
Max
+25
°
C I
Full
+25
°
C I
Full
+25
°
C
+25
°
C
+25
°
C
0.25 0.75
0.4
0.75
1.0
2.5
3.0
0.25 0.75
0.4
0.75 LSB
1.0
2.5
VI
1.0
2.5
1.0
2.5
LSB
LSB
LSB
MHz
ns
ns
Integral Nonlinearity
1.2
1.25 3.0
150
10
10
1.2
1.25
150
10
10
1.2
1.25 3.0
150
10
10
1.2
1.25 3.0
150
10
10
VI
V
V
V
ANALOG INPUT BANDWIDTH
TRANSIENT RESPONSE
OVERVOLTAGE RECOVERY
SFDR
1
Analog Input @ 1.2 MHz
+25
°
C
Full
+25
°
C
Full
+25
°
C
Full
I
VI
I
VI
I
VI
70
68
70
68
70
68
77
75
76
74
75
73
70
68
70
68
65
63
77
75
75
73
72
70
70
68
70
68
70
68
77
75
76
74
75
73
70
68
70
68
70
68
77
75
76
74
74
72
dBc
dBc
dBc
dBc
dBc
dBc
9.6 MHz
13.4 MHz
SINAD
2
Analog Input @ 1.2 MHz
+25
°
C
Full
+25
°
C
Full
+25
°
C
Full
I
VI
I
VI
I
VI
61
60
60
59
59
58
65
64
64
63
63
62
60
59
59
58
57
56
63
62
62
61
61
60
62
61
61
60
61
60
65
64
65
64
64
63
61
60
60
59
60
59
65
64
64
63
64
63
dB
dB
dB
dB
dB
dB
9.6 MHz
13.4 MHz
SNR
3
Analog Input @ 1.2 MHz
+25
°
C
Full
+25
°
C
Full
+25
°
C
Full
I
VI
I
VI
I
VI
62
61
61
60
60
59
65
64
64
63
63
62
61
60
60
59
59
58
64
63
63
62
62
61
63
62
62
61
62
61
65
64
65
64
65
64
62
61
61
60
61
60
65
64
65
64
65
64
dB
dB
dB
dB
dB
dB
9.6 MHz
13.4 MHz
Two-Tone IMD Rejection
4
F1 = 8.1 MHz; F2 = 9.6 MHz
Two-Tone SFDR
5
F1 = 8.1 MHz; F2 = 9.6 MHz
NOTES
1
Analog Input signal power at –1 dBFS; spurious-free dynamic range (SFDR) is the ratio of the signal level to worst spur, usually limited by harmonics.
2
Analog Input signal power at –1 dBFS; signal-to-noise and distortion (SINAD) is the ratio of signal level to total noise + harmonics.
3
Analog Input signal power at –1 dBFS; signal-to-noise ratio (SNR) is the ratio of signal level to total noise (first five harmonics removed).
4
Both input tones at –7 dBFS; two tone intermodulation distortion (IMD) rejection is the ratio of either tone to the worst 3rd order intermod product.
5
Both input tones at –7 dBFS; two tone spurious-free dynamic range (SFDR) is the ratio of either tone to the worst spurious signal.
Specifications subject to change without notice.
WAFER TEST LIMITS
1
(+V
S
= +5 V, –V
S
= –5.2 V unless otherwise noted)
+25
°
C
I
75
83
75
83
75
85
75
85
dBc
+25
°
C
I
68
75
68
75
68
75
68
75
dBc
AD9026CHIPS
Min
AD9027CHIPS
Min
Parameter
POWER SUPPLY
+V
S
Supply Current
–V
S
Supply Current
ENCODE INPUT
Logic “1” Current
Logic “0” Current
ANALOG INPUT
Input Resistance
DC ACCURACY
Offset Error
Gain Error
No Missing Codes
Differential Nonlinearity
NOTES
1
Electrical test is performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice.
2
Die substrate is connected to –V
S
.
Typ
Max
Typ
Max
Units
100
160
140
246
90
180
128
258
mA
mA
20
20
10
10
μ
A
μ
A
225
375
225
375
–20
–4.5
Guaranteed
–0.65
20
4.5
–20
–4.5
Guaranteed
–0.65
20
4.5
mV
% FS
0.65
0.65
LSB
REV. 0
–3–
AC SPECIFICATIONS
(+V
S
= +5 V; –V
S
= –5.2 V; Encode = 25.6 MSPS (50% duty cycle) for A Grade Parts; Encode = 31.0 MSPS
(50% duty cycle) for B Grade Parts unless otherwise noted)
AD9026/AD9027