(TA = 25 °C, unless otherwise noted" />
參數(shù)資料
型號(hào)： AD7851ARSZ-REEL
廠商： Analog Devices Inc
文件頁(yè)數(shù)： 34/36頁(yè)
文件大小： 0K
描述： IC ADC 14BIT SRL 333KSPS 24SSOP
標(biāo)準(zhǔn)包裝： 1,500
位數(shù)： 14
采樣率（每秒）： 333k
數(shù)據(jù)接口： 8051，QSPI?，串行，SPI? µP
轉(zhuǎn)換器數(shù)目： 2
功率耗散（最大）： 89.25mW
電壓電源： 模擬和數(shù)字
工作溫度： -40°C ~ 85°C
安裝類型： 表面貼裝
封裝/外殼： 24-SSOP（0.209"，5.30mm 寬）
供應(yīng)商設(shè)備封裝： 24-SSOP
包裝： 帶卷 (TR)
輸入數(shù)目和類型： 1 個(gè)偽差分，單極；1 個(gè)偽差分，雙極
–7–
REV. B
AD7851
ABSOLUTE MAXIMUM RATINGS
1
(TA = 25
°C, unless otherwise noted.)
AVDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
DVDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
AVDD to DVDD . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V
Analog Input Voltage to AGND . . . . . –0.3 V to AVDD + 0.3 V
Digital Input Voltage to DGND . . . . –0.3 V to DVDD + 0.3 V
Digital Output Voltage to DGND . . . –0.3 V to DVDD + 0.3 V
REFIN/REFOUT to AGND . . . . . . . . . . –0.3 V to AVDD + 0.3 V
Input Current to Any Pin Except Supplies
2 . . . . . . . . .
±10 mA
Operating Temperature Range
Commercial (A, K Versions) . . . . . . . . . . . –40
°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65
°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150
°C
PDIP Package, Power Dissipation . . . . . . . . . . . . . . . . 450 mW
θ
JA Thermal Impedance
. . . . . . . . . . . . . . . . . . . . . 105
°C/W
θJC Thermal Impedance . . . . . . . . . . . . . . . . . . . . .34.7°C/W
Lead Temperature, (Soldering, 10 secs) . . . . . . . . . . 260
°C
SOIC, SSOP Package, Power Dissipation . . . . . . . . . 450 mW
θJA Thermal Impedance . . 75°C/W (SOIC), 122.28°C/W (SSOP)
θ
JC Thermal Impedance . . . 25
°C/W (SOIC), 31.25°C/W (SSOP)
PINOUT FOR DIP, SOIC, AND SSOP
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
AD7851
TOP VIEW
(Not to Scale)
CONVST
BUSY
SLEEP
REFIN/REFOUT
AVDD
AGND
CREF1
CREF2
AIN(+)
AIN(–)
NC
AGND
SYNC
SCLK
CLKIN
DIN
DOUT
DGND
DVDD
CAL
SM2
SM1
POLARITY
AMODE
NC = NO CONNECT
ORDERING GUIDE
1
Linearity
Temperature
Error
Throughput
Package
Model
Range
(LSB)
2
Rate (kSPS)
at 125 C (kSPS) Description
Options
3
AD7851AN
–40
°C to +85°C
±2
333
238
PDIP
N-24
AD7851KN
0
°C to 85°C
±1
285
238
PDIP
N-24
AD7851AR
–40
°C to +85°C
±2
333
238
SOIC
R-24
AD7851AR-REEL
–40
°C to +85°C
±2
333
238
SOIC
R-24
AD7851ARZ
3
–40
°C to +85°C
±2
333
238
SOIC
R-24
AD7851ARZ-REEL
3
–40
°C to +85°C
±2
333
238
SOIC
R-24
AD7851KR
0
°C to 85°C
±1
285
238
SOIC
R-24
AD7851KR-REEL
0
°C to 85°C
±1
285
238
SOIC
R-24
AD7851KRZ
3
0
°C to 85°C
±1
285
238
SOIC
R-24
AD7851KRZ-REEL
3
0
°C to 85°C
±1
285
238
SOIC
R-24
AD7851ARS
–40
°C to +85°C
±2
333
238
SSOP
RS-24
AD7851ARS-REEL
–40
°C to +85°C
±2
333
238
SSOP
RS-24
EVAL-AD7851CB
4
Evaluation Board
EVAL-CONTROL BRD2
5
Controller Board
NOTES
1Both A and K Grades are guaranteed up to 125
°C, but at a lower throughput of 238 kHz (5 MHz).
2Linearity error refers to the integral linearity error.
3Z = Pb-free part.
4This can be used as a standalone evaluation board or in conjunction with the EVAL-CONTROL BOARD for evaluation/demonstration purposes.
5This board is a complete unit allowing a PC to control and communicate with all Analog Devices, Inc. evaluation boards ending in the CB designators. To order a
complete evaluation kit, the particular ADC evaluation board needs to be ordered, e.g., EVAL-AD7851CB, the EVAL-CONTROL BRD2, and a 12 V ac trans-
former. See the Evaluation Board application note for more information.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD7851 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
Lead Temperature, Soldering
Vapor Phase (60 secs) . . . . . . . . . . . . . . . . . . . . . . . 215
°C
Infrared (15 secs) . . . . . . . . . . . . . . . . . . . . . . . . . . 220
°C
ESD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >1.5 kV
NOTES
1Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2Transient currents of up to 100 mA will not cause SCR latch-up.
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