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參數(shù)資料
| 型號： | AD7701BRZ |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 15/20頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC ADC 16BIT LC2MOS MONO 20SOIC |
| 標準包裝： | 1 |
| 位數(shù)： | 16 |
| 采樣率（每秒）： | 4k |
| 數(shù)據(jù)接口： | 串行 |
| 轉(zhuǎn)換器數(shù)目： | 1 |
| 功率耗散（最大）： | 37mW |
| 電壓電源： | 模擬和數(shù)字，雙 ± |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 20-SOIC（0.295"，7.50mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 20-SOIC W |
| 包裝： | 管件 |
| 輸入數(shù)目和類型： | 1 個單端，單極；1 個單端，雙極 |
REV. E
–4–
AD7701
ABSOLUTE MAXIMUM RATINGS
1
(TA = 25
°C, unless otherwise noted.)
DVDD to AGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6 V
DVDD to AVDD . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V
DVSS to AGND . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –6 V
AVDD to AGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6 V
AVSS to AGND . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –6 V
AGND to DGND . . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V
Digital Input Voltage to DGND . . . . –0.3 V to DVDD + 0.3 V
Analog Input
Voltage to AGND . . . . . . . . AVSS – 0.3 V to AVDD + 0.3 V
Input Current to Any Pin Except Supplies
2 . . . . . . . .
±10 mA
Operating Temperature Range
Commercial Plastic (A, B Versions) . . . . . –40
°C to +85°C
Industrial CERDIP (A, B Versions) . . . . . . –40
°C to +85°C
Extended CERDIP (S, T Versions) . . . . . –55
°C to +125°C
Storage Temperature Range. . . . . . . . . . . . . –65
°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . . . 300
°C
Power Dissipation (Any Package) to 75
°C . . . . . . . . . 450 mW
Derates above 75
°C by . . . . . . . . . . . . . . . . . . . . . 10 mW/°C
NOTES
1Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2Transient currents of up to 100 mA will not cause SCR latch-up.
PDIP, CERDIP, SOIC
MODE
SC1
DGND
CLKOUT
CLKIN
AGND
DVSS
AVSS
AIN
VREF
SDATA
SCLK
SC2
CAL
AVDD
DVDD
DRDY
CS
BP/
UP
SLEEP
TOP VIEW
(Not to Scale)
AD7701
1
2
3
4
5
6
7
8
9
10
14
13
12
11
20
19
18
17
16
15
SSOP
MODE
SC1
DGND
CLKOUT
CLKIN
AGND
DVSS
AVSS
AIN
VREF
SDATA
SCLK
SC2
CAL
AVDD
DVDD
DRDY
CS
BP/
UP
SLEEP
TOP VIEW
(Not to Scale)
AD7701
1
2
3
4
5
6
7
8
9
10
14
13
12
11
20
19
18
17
16
15
21
22
23
24
25
26
27
28
NC
NC = NO CONNECT
PIN CONFIGURATIONS
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD7701 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
ORDERING GUIDE
Temperature
Linearity
Package
Model
Range
Error (% FSR)
Options
*
AD7701AN
–40
°C to +85°C
0.003
N-20
AD7701BN
–40
°C to +85°C
0.0015
N-20
AD7701AR
–40
°C to +85°C
0.003
R-20
AD7701BR
–40
°C to +85°C
0.0015
R-20
AD7701ARS
–40
°C to +85°C
0.003
RS-28
AD7701AQ
–40
°C to +85°C
0.003
Q-20
AD7701BQ
–40
°C to +85°C
0.0015
Q-20
AD7701SQ
–55
°C to +125°C
0.003
Q-20
AD7701TQ
–55
°C to +125°C
0.0015
Q-20
*N = PDIP; Q = CERDIP; R = SOIC; RS = SSOP.
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