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參數(shù)資料
| 型號(hào)： | AD5641 |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | 2.7 V to 5.5 V, <100 uA, 14-Bit nanoDAC D/A in SC70 Package |
| 中文描述： | 2.7 V至5.5 V，“100微安，14位nanoDAC系列數(shù)/采用SC70阿包 |
| 文件頁數(shù)： | 7/20頁 |
| 文件大?。?/td> | 572K |
| 代理商： | AD5641 |
Preliminary Technical Data
AD5641
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer
function. A typical INL versus code plot can be seen in Figure 4.
Rev. PrC | Page 7 of 20
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. A typical DNL versus code plot can be
seen in Figure 7.
Zero-Code Error
Zero-code error is a measure of the output error when zero
code (0x0000) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5641, because the output of the DAC cannot go below 0 V.
Zero-code error is due to a combination of the offset errors in
the DAC and output amplifier. Zero-code error is expressed in
mV. A plot of zero-code error versus temperature can be seen in
Figure 6.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded to the DAC register. Ideally, the output
should be V
DD
1 LSB. Full-scale error is expressed in percent
of full-scale range. A plot of full-scale error versus temperature
can be seen in Figure 6.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from ideal,
expressed as a percent of the full-scale range.
Total Unadjusted Error
Total unadjusted error (TUE) is a measure of the output error
taking all the various errors into account. A typical TUE versus
code plot can be seen in Figure 5.
Zero-Code Error Drift
Zero-code error drift is a measure of the change in zero-code
error with a change in temperature. It is expressed in μV/°C.
Gain Error Drift
Gain error drift is a measure of the change in gain error with
changes in temperature. It is expressed in (ppm of full-scale
range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000). See
Figure 18.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It is
specified in nV-s and is measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
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