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參數(shù)資料
| 型號： | AD5621AKSZ-500RL7 |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 5/24頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC DAC 12BIT V-OUT SC70-6 |
| 產(chǎn)品培訓(xùn)模塊： | Data Converter Fundamentals DAC Architectures |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | nanoDAC™ |
| 設(shè)置時(shí)間： | 6µs |
| 位數(shù)： | 12 |
| 數(shù)據(jù)接口： | DSP，MICROWIRE?，QSPI?，串行，SPI? |
| 轉(zhuǎn)換器數(shù)目： | 1 |
| 電壓電源： | 單電源 |
| 功率耗散（最大）： | 500µW |
| 工作溫度： | -40°C ~ 125°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 6-TSSOP，SC-88，SOT-363 |
| 供應(yīng)商設(shè)備封裝： | SC-70-6 |
| 包裝： | 標(biāo)準(zhǔn)包裝 |
| 輸出數(shù)目和類型： | 1 電壓，單極；1 電壓，雙極 |
| 其它名稱： | AD5621AKSZ-500RL7DKR |
Data Sheet
AD5601/AD5611/AD5621
Rev. G | Page 13 of 24
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer func-
tion. See Figure 5 to Figure 7 for plots of typical INL vs. code.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. See Figure 11 to Figure 13 for plots of
typical DNL vs. code.
Zero-Code Error
Zero-code error is a measure of the output error when zero
code (0x0000) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5601/AD5611/AD5621 because the output of the DAC cannot
go below 0 V. Zero-code error is due to a combination of the
offset errors in the DAC and output amplifier. Zero-code error
is expressed in mV. See Figure 28 for a plot of zero-code error
vs. temperature.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded to the DAC register. Ideally, the output
should be VDD 1 LSB. Full-scale error is expressed in mV. See
Figure 28 for a plot of full-scale error vs. temperature.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percent of the full-scale range.
Total Unadjusted Error
Total unadjusted error (TUE) is a measure of the output error,
taking all the various errors into account. See Figure 8 to
Figure 10 for plots of typical TUE vs. code.
Zero-Code Error Drift
Zero-code error drift is a measure of the change in zero-code
error with a change in temperature. It is expressed in V/°C.
Gain Temperature Coefficient
Gain temperature coefficient is a measure of the change in gain
error with changes in temperature. It is expressed in (ppm of
full-scale range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x2000 to 0x1FFF). See
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated.
It is specified in nV-s and is measured with a full-scale code
change on the data bus—from all 0s to all 1s and vice versa.
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