參數(shù)資料
型號(hào): AD549KHZ
廠商: Analog Devices Inc
文件頁(yè)數(shù): 6/20頁(yè)
文件大?。?/td> 0K
描述: IC OPAMP GP 1MHZ LP 20MA TO99-8
標(biāo)準(zhǔn)包裝: 1
系列: Topgate™
放大器類(lèi)型: 通用
電路數(shù): 1
轉(zhuǎn)換速率: 3 V/µs
增益帶寬積: 1MHz
電流 - 輸入偏壓: 0.075pA
電壓 - 輸入偏移: 150µV
電流 - 電源: 600µA
電流 - 輸出 / 通道: 20mA
電壓 - 電源,單路/雙路(±): ±5 V ~ 18 V
工作溫度: 0°C ~ 70°C
安裝類(lèi)型: 通孔
封裝/外殼: TO-99-8 金屬罐
供應(yīng)商設(shè)備封裝: TO-99-8
包裝: 散裝
產(chǎn)品目錄頁(yè)面: 773 (CN2011-ZH PDF)
AD549
Rev. H | Page 14 of 20
The test apparatus is calibrated without a device under test
present. After power is turned on, a 5 minute stabilization
period is required. First, VERR1 and VERR2 are measured. These
voltages are the errors caused by the offset voltages and leakage
currents of the I-to-V converters.
VERR1 = 10 (VOSA – IBA × RSa)
VERR2 = 10 (VOSB – IBB × RSb)
00
51
1-
0
40
VOS
+
2
3
6
8
A
AD549
R2
9.01k
R1
1k
RSa
1010
+
VERR1/VA
VERR2/VB
VOUT
CAL/TEST
CC
20pF
CF
0.1F
+
3
2
6
8
B
AD549
R2
9.01k
R1
1k
RSb
1010
CC
20pF
CF
0.1F
CF
0.1F
R1
1k
R2
9.01k
DEVICE
UNDER
TEST
I (+)
I (–)
GUARD
Figure 40. Sample and Difference Circuit for Measuring
Electrometer Leakage Currents
Once measured, these errors are subtracted from the readings
taken with a device under test present. Amplifier B closes the
feedback loop to the device under testing in addition to pro-
viding the I-to-V conversion. The offset error of the device
under testing appears as a common-mode signal and does not
affect the test measurement. As a result, only the leakage
current of the device under testing is measured.
VA – VERR1 = 10[RSa × IB(+)]
VX – VERR2 = 10[RSb × IB(–)]
Although a series of devices can be tested after only one calibra-
tion measurement, calibration should be updated periodically
to compensate for any thermal drift of the I-to-V converters or
changes in the ambient environment. Laboratory results have
shown that repeatable measurements within 10 fA can be realized
when this apparatus is properly implemented. These results are
achieved in part by the design of the circuit, which eliminates
relays and other parasitic leakage paths in the high impedance
signal lines, and in part by the inherent cancellation of errors
through the calibration and measurement procedure.
PHOTODIODE INTERFACE
The low input current and low input offset voltage of the AD549
make it an excellent choice for very sensitive photodiode preamps
(see Figure 41). The photodiode develops a signal current, IS,
equal to
IS = R × P
where P is light power incident on the diode surface, in watts,
and R is the photodiode responsivity in amps/watt. RF converts
the signal current to an output voltage
VOUT = RF × IS
00
51
1-
04
1
2
3
6
5
1
4
AD549
–VS
CF
10pF
IS
RF
109
10k
1F
VOUT
+
Figure 41. Photodiode Preamp
The dc error sources and an equivalent circuit for a small area
(0.2 mm square) photodiode are indicated in Figure 42.
00
51
1-
0
42
A
+
VOUT
VOS
+
IS
IS
RS
109
CS
20pF
RF
109
CF
10pF
Figure 42. Photodiode Preamp DC Error Sources
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