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參數(shù)資料
| 型號： | AD5426 |
| 廠商： | Analog Devices, Inc. |
| 元件分類： | 串行DAC |
| 英文描述： | Dual 8-,10-,12-Bit High Bandwidth Multiplying DACs with Serial Interface |
| 中文描述： | 雙8 - ，10 - 12位高帶寬倍增DAC的串行接口 |
| 文件頁數(shù)： | 7/32頁 |
| 文件大小： | 860K |
| 代理商： | AD5426 |
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AD5429/AD5439/AD5449
ABSOLUTE MAXIMUM RATINGS
Rev. 0 | Page 7 of 32
Table 3.
Parameter
V
DD
to GND
V
REF
, R
FB
to GND
I
OUT
1, I
OUT
2 to GND
Input Current to Any Pin except Supplies
Logic Inputs and Output
1
Operating Temperature Range
Extended (Y Version)
Storage Temperature Range
Junction Temperature
16-Lead TSSOP θ
JA
Thermal Impedance
Lead Temperature, Soldering (10 s)
IR Reflow, Peak Temperature (< 20 s)
1
Overvoltages at SCLK, SYNC, and DIN are clamped by internal diodes.
Current should be limited to the maximum ratings given.
Rating
0.3 V to +7 V
12 V to +12 V
0.3 V to +7 V
±10 mA
0.3 V to V
DD
+ 0.3 V
40°C to +125°C
65°C to +150°C
150°C
150°C/W
300°C
235°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability. Only one absolute maximum rating may be
applied at any one time.
Transient currents of up to 100 mA do not cause SCR latch-up.
T
A
= 25°C unless otherwise noted.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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