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參數(shù)資料
| 型號(hào)： | AD5300BRM-REEL |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | DAC |
| 英文描述： | +2.7 V to +5.5 V, 140 uA, Rail-to-Rail Output 8-Bit DAC in an SOT-23 |
| 中文描述： | SERIAL INPUT LOADING, 4 us SETTLING TIME, 8-BIT DAC, PDSO8 |
| 封裝： | MO-187AA, MSOP-8 |
| 文件頁數(shù)： | 5/12頁 |
| 文件大?。?/td> | 197K |
| 代理商： | AD5300BRM-REEL |
AD5300
–5–
REV. C
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight line
passing through the endpoints of the DAC transfer function. A
typical INL vs. code plot can be seen in Figure 2.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of
±
1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. A typical DNL vs. code plot can be seen
in Figure 3.
Zero-Code Error
Zero-code error is a measure of the output error when zero code
(00 Hex) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5300 because the output of the DAC cannot go below 0 V.
This is due to a combination of the offset errors in the DAC
and output amplifier. Zero-code error is expressed in LSBs. A
plot of zero-code error vs. temperature can be seen in Figure 6.
Full-Scale Error
Full-scale error is a measure of the output error when full-
scale code (FF Hex) is loaded to the DAC register. Ideally,
the output should be V
DD
– 1 LSB. Full-scale error is expressed
in LSBs. A plot of full-scale error vs. temperature can be
seen in Figure 6.
Gain Error
This is a measure of the span error of the DAC. It is the devia-
tion in slope of the DAC transfer characteristic from ideal
expressed as a percent of the full-scale range.
Total Unadjusted Error
Total unadjusted error (TUE) is a measure of the output error
taking into account all the various errors. A typical TUE vs.
code plot can be seen in Figure 4.
Zero-Code Error Drift
This is a measure of the change in zero-code error with a
change in temperature. It is expressed in
μ
V/
°
C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/
°
C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-secs
and is measured when the digital input code is changed by
1 LSB at the major carry transition (7F Hex to 80 Hex). See
Figure 19.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into the
analog output of the DAC from the digital inputs of the DAC
but is measured when the DAC output is not updated. It is
specified in nV-secs and is measured with a full-scale code
change on the data bus, i.e., from all 0s to all 1s, and vice versa.
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