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參數(shù)資料
| 型號： | ACFM-7102-TR1 |
| 廠商： | Avago Technologies Ltd. |
| 英文描述： | PCS/Cellular/S-GPS Quintplexer |
| 中文描述： | 件/蜂窩/ S的全球定位系統(tǒng)Quintplexer |
| 文件頁數(shù)： | 4/16頁 |
| 文件大?。?/td> | 1509K |
| 代理商： | ACFM-7102-TR1 |
4
Absolute Maximum Ratings
[1]
Parameter
Unit
Value
Storage temperature
Maximum RF Input Power to Tx Ports
°C
dBm
–65 to +5
+33
Parameter
Unit
Value
Operating temperature, Tc
[3]
, Tx Power ≤ 9 dBm
Operating temperature, Tc
[3]
, Tx Power ≤ 30 dBm
°C
°C
–40 to +00
–40 to +85
Notes:
1) Operation in excess of any one of these conditions may result in permanent damage to the device.
2) The device will function over the recommended range without degradation in reliability or permanent change in performance, but is not
guaranteed to meet electrical specifications.
3) T
C
is defined as case temperature, the temperature of the underside of the quintplexer where it makes contact with the circuit board.
Maximum Recommended Operating Conditions
[2]
Characterization
A test circuit similar to that shown in Figure 1 was used
to measure device performance. This circuit is designed
to interface with Air Coplanar (ACP), Ground-Signal-
Ground (GSG) RF probes of the type commonly used to
test semiconductor wafers.
The test circuit is a 17 x 14 mm PCB with a well-grounded
pad to which the device under test (DUT) is solder-
mounted.
Short lengths of 50-ohm microstripline connect the DUT
to ACP probe patterns on the board.
A test circuit with an ACFM-7102 mounted in place is
shown in Figure 2. S-parameters are measured using a
vector network analyzer and calibrated ACP probe set.
Phase data for s-parameters measured with ACP probe
circuits are adjusted to place the reference plane at the
edge of the quintplexer package.
Figure 1. ACP Probe Test Circuit.
Figure 2. Test Circuit with ACFM-7102 Quintplexer.
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