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參數(shù)資料
| 型號： | A3150UA-LT |
| 廠商： | Allegro MicroSystems, Inc. |
| 英文描述： | 320 x 240 pixel format, CFL backlight available with power harness |
| 中文描述： | 可編程，CHOPPERSTABILIZED，霍爾效應(yīng)開關(guān) |
| 文件頁數(shù)： | 11/12頁 |
| 文件大?。?/td> | 100K |
| 代理商： | A3150UA-LT |
115 Northeast Cutoff, Box 15036
Worcester, Massachusetts 01615-0036 (508) 853-5000
3150
PROGRAMMABLE, CHOPPER-
STABILIZED, PRECISION,
HALL-EFFECT SWITCH
All Allegro sensors are subjected to stringent qualification requirements prior to being released to production.
To become qualified, except for the destructive ESD tests, no failures are permitted.
CRITERIA FOR DEVICE QUALIFICATION
Qualification Test
Test Method and Test Conditions
Test Length
Samples
Comments
Biased Humidity (HAST)
TA = 130°C, RH = 85%
50 hrs
77
VCC = VOUT = 5 V
High-Temperature
JESD22-A108,
408 hrs
77
VCC = 24 V,
Operating Life (HTOL)
TA = 150°C, TJ = 165°CVOUT = 20 V
Accelerated HTOL
JESD22-A108,
504 hrs
77
VCC = 24 V,
TA = 175°C, TJ = 190°CVOUT = 20 V
Autoclave, Unbiased
JESD22-A102, Condition C,
96 hrs
77
TA = 121°C, 15 psig
High-Temperature
MIL-STD-883, Method 1008,
1000 hrs
77
(Bake) Storage Life
TA = 170°C
Temperature Cycle
MIL-STD-883, Method 1010,
500 cycles
77
-65
°C to +150°C
Latch-Up
—
Pre/Post
6
Reading
Electro-Thermally
—
Pre/Post
6
Induced Gate Leakage
Reading
ESD,
CDF-AEC-Q100-002
Pre/Post
x per
Test to failure,
Human Body Model
Reading
test
All leads > TBD
Electrical Distributions
Per Specification
—
30
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