
A29L004A Series
PRELIMINARY
(March, 2005, Version 0.0)
31
AMIC Technology, Corp.
Test Conditions
Test Specifications
Test Condition
-70
-90
Unit
Output Load
1 TTL gate
Output Load Capacitance, C
L
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
5
5
ns
Input Pulse Levels
0.0 - 3.0
0.0 - 3.0
V
Input timing measurement reference levels
1.5
1.5
V
Output timing measurement reference levels
Test Setup
1.5
1.5
V
6.2 K
Device
Under
Test
C
L
Diodes = IN3064 or Equivalent
2.7 K
3.3 V