參數(shù)資料
型號(hào)： A10V20B-VQG80C
廠商： Microsemi SoC
文件頁(yè)數(shù)： 12/98頁(yè)
文件大小： 0K
描述： IC FPGA 2K GATES 80-VQFP COM
標(biāo)準(zhǔn)包裝： 90
系列： ACT™ 1
LAB/CLB數(shù)： 547
輸入/輸出數(shù)： 69
門(mén)數(shù)： 2000
電源電壓： 2.7 V ~ 3.6 V
安裝類型： 表面貼裝
工作溫度： 0°C ~ 70°C
封裝/外殼： 80-TQFP
供應(yīng)商設(shè)備封裝： 80-VQFP（14x14）
2
H i g h -R e lia b i lity, L o w -R is k S o lu t i o n
Actel builds the most reliable field programmable gate arrays
(FPGAs) in the industry, with overall antifuse reliability
ratings
of
less
than
10
Failures-In-Time
(FITs),
corresponding to a useful life of more than 40 years. Actel
FPGAs have been production proven, with more than five
million devices shipped and more than one trillion antifuses
manufactured. Actel devices are fully tested prior to
shipment, with an outgoing defect level of less than 100 ppm.
(Further reliability data is available in the Actel Device
Reliability Report, at http://www.actel.com/hirel).
Be ne f i t s
Mi ni m i zed C o s t Ri s k
With Actel’s line of development tools, designers can produce
as many chips as they choose for just the cost of the device
itself. There will be no NRE charges to cut into the
development budget each time a new design is tried.
Mi ni m i zed T i m e R i s k
After the design is entered, placement and routing is
automatic, and programming the device takes only about 5 to
15 minutes for an average design. Designers save time in the
design entry process by using tools with which they are
familiar.
Mi ni m i zed R e l i abi l i ty R i s k
The PLICE antifuse is a one-time programmable, nonvolatile
connection.
Since
Actel
devices
are
permanently
programmed, no downloading from EPROM or SRAM storage
is required. Inadvertent erasure is impossible, and there is no
need to reload the program after power disruptions.
Fabrication using a low-power CMOS process means cooler
junction temperatures. Actel’s non-PLD architecture delivers
lower dynamic operating current. Our reliability tests show a
very low failure rate of 6.6 FITs at 90°C junction temperature
with no degradation in AC performance. Special stress testing
at wafer test eliminates infant mortalities prior to packaging.
M i ni m i zed S ecu ri ty R i s k
Reverse engineering of programmed Actel devices from
optical or electrical data is extremely difficult. Programmed
antifuses cannot be identified from a photograph or by using
an SEM. The antifuse map cannot be deciphered either
electrically or by microprobing. Each device has a silicon
signature that identifies its origins, down to the wafer lot and
fabrication facility.
M i ni m i zed T e s ti ng Ri s k
Unprogrammed Actel parts are extensively tested at the
factory. Routing tracks, logic modules, and programming,
debug and test circuits are 100 percent tested before
shipment. AC performance is ensured by special speed path
tests, and programming circuitry is verified on test antifuses.
During the programming process, an algorithm is run to
ensure that all antifuses are correctly programmed. In
addition, Actel’s Silicon Explorer diagnostic tool uses
ActionProbe circuitry, allowing 100 percent observability of
all internal nodes to check and debug the design.
Act e l F P GA D e s c r i pt i o n
The Actel families of FPGAs offer a variety of packages,
speed/performance characteristics, and processing levels for
use in all high reliability and military applications. Devices
are implemented in a silicon gate, two-level metal CMOS
process, utilizing Actel’s PLICE antifuse technology. This
P r o d u c t F a m ily P r o f ile
Family
ACT 2
ACT 1
Device
A1240A
A1280A
A1010B
A1020B
Capacity
System Gates
Logic Gates
SRAM Bits
6,000
4,000
NA
12,000
8,000
NA
1,800
1,200
NA
3,000
2,000
NA
Logic Modules
S-Modules
C-Modules
Decode
684
348
336
NA
1,232
624
608
NA
295
—
295
NA
547
—
547
NA
Flip-Flops (maximum)
568
998
147
273
User I/Os (maximum)
104
140
57
69
Packages (by pin count)
CPGA
CQFP
132
—
176
172
84
—
84
Performance
System Speed (maximum)
40 MHz
20 MHz
相關(guān)PDF資料
PDF描述
A1020B-1VQ80C IC FPGA 2K GATES 80-VQFP COM
A10V20B-VQ80C IC FPGA 2K GATES 80-VQFP COM
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