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參數資料
| 型號： | 93C66BTISTG |
| 廠商： | Microchip Technology Inc. |
| 元件分類： | EEPROM |
| 英文描述： | 4K Microwire Compatible Serial EEPROM |
| 中文描述： | 4K的微絲兼容串行EEPROM |
| 文件頁數： | 18/24頁 |
| 文件大小： | 405K |
| 代理商： | 93C66BTISTG |
2003 Microchip Technology Inc.
DS21795B-page 3
93AA66A/B/C, 93LC66A/B/C, 93C66A/B/C
TABLE 1-2:
AC CHARACTERISTICS
All parameters apply over the specified
ranges unless otherwise noted.
VCC = range by device (see Table on Page 1)
Industrial (I):
TA = -40°C to +85°C
Automotive (E):
TA = -40°C to +125°C
Param.
No.
Symbol
Parameter
Min
Max
Units
Conditions
A1
FCLK
Clock frequency
—
3
2
1
MHz
4.5V
≤ VCC < 5.5V, 93XX66C only
2.5V
≤ VCC < 5.5V
1.8V
≤ VCC < 2.5V
A2
TCKH
Clock high time
200
250
450
—ns
ns
4.5V
≤ VCC < 5.5V, 93XX66C only
2.5V
≤ VCC < 5.5V
1.8V
≤ VCC < 2.5V
A3
TCKL
Clock low time
100
200
450
—ns
ns
4.5V
≤ VCC < 5.5V, 93XX66C only
2.5V
≤ VCC < 5.5V
1.8V
≤ VCC < 2.5V
A4
TCSS
Chip Select setup time
50
100
250
—ns
ns
4.5V
≤ VCC < 5.5V
2.5V
≤ VCC < 4.5V
1.8V
≤ VCC < 2.5V
A5
TCSH
Chip Select hold time
0
—
ns
1.8V
≤ VCC < 5.5V
A6
TCSL
Chip Select low time
250
—
ns
1.8V
≤ VCC < 5.5V
A7
TDIS
Data input setup time
50
100
250
—ns
ns
4.5V
≤ VCC < 5.5V, 93XX66C only
2.5V
≤ VCC < 5.5V
1.8V
≤ VCC < 2.5V
A8
TDIH
Data input hold time
50
100
250
—ns
ns
4.5V
≤ VCC < 5.5V, 93XX66C only
2.5V
≤ VCC < 5.5V
1.8V
≤ VCC < 2.5V
A9
TPD
Data output delay time
—
200
250
400
ns
4.5V
≤ VCC < 5.5V, CL = 100 pF
2.5V
≤ VCC < 4.5V, CL = 100 pF
1.8V
≤ VCC < 2.5V, CL = 100 pF
A10
TCZ
Data output disable time
—
100
200
ns
4.5V
≤ VCC < 5.5V, (Note 1)
1.8V
≤ VCC < 4.5V, (Note 1)
A11
TSV
Status valid time
—
200
300
500
ns
4.5V
≤ VCC < 5.5V, CL = 100 pF
2.5V
≤ VCC < 4.5V, CL = 100 pF
1.8V
≤ VCC < 2.5V, CL = 100 pF
A12
TWC
Program cycle time
—
6
ms
Erase/Write mode (AA and LC ver-
sions)
A13
TWC
—
2
ms
Erase/Write mode
(93C versions)
A14
TEC
—
6
ms
ERAL mode, 4.5V
≤ VCC ≤ 5.5V
A15
TWL
—
15
ms
WRAL mode, 4.5V
≤ VCC ≤ 5.5V
A16
—
Endurance
1M
—
cycles 25°C, VCC = 5.0V, (Note 2)
Note 1:
This parameter is periodically sampled and not 100% tested.
2:
This application is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance Model which may be obtained from
www.microchip.com.
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