
2004 Microchip Technology Inc.
DS20067J-page 3
93AA46/56/66
TABLE 1-1:
DC AND AC ELECTRICAL CHARACTERISTICS
VCC = +1.8V to +5.5V
Commercial (C): TA = 0°C to +70°C
Industrial (I):
TA = -40°C to +85°C
Parameter
Symbol
Min
Typ
Max
Units
Conditions
High-level input voltage
VIH12.0
—
VCC+1
V
VCC
≥ 2.7V
VIH20.7 VCC
—VCC+1
V
VCC < 2.7V
Low-level input voltage
VIL1
-0.3
—
0.8
V
VCC
≥ 2.7V
VIL2
-0.3
—
0.2 VCC
VVCC < 2.7V
Low-level output voltage
VOL1—
—
0.4
V
IOL = 2.1 mA; VCC = 4.5V
VOL2—
—
0.2
V
IOL = 100
A; VCC = 1.8V
High-level output voltage
VOH12.4
—
V
IOH = -400
A; VCC = 4.5V
VOH2VCC-0.2
—
V
IOH = -100
A; VCC = 1.8V
Input leakage current
ILI
-10
—
10
AVIN = 0.1V to VCC
Output leakage current
ILO
-10
—
10
AVOUT = 0.1V to VCC
Pin capacitance
(all inputs/outputs)
CIN, COUT
——
7
pF
VIN/VOUT = 0V (Note 1 & 2)
TA = +25°C, FCLK = 1 MHz
Operating current
ICC write
—
3
mA
FCLK = 2 MHz; VCC=5.5V
(Note 2)
ICC read
—
70
1
500
mA
A
FCLK = 2 MHz; VCC = 5.5V
FCLK = 1 MHz; VCC = 3.0V
FCLK = 1 MHz; VCC = 1.8V
Standby current
ICCS
2
100
30
A
CLK = CS = 0V; VCC = 5.5V
CLK = CS = 0V; VCC = 3.0V
CLK = CS = 0V; VCC = 1.8V
ORG, DI = VSS or VCC
Clock frequency
FCLK
2
1
MHz
VCC
≥ 4.5V
VCC < 4.5V
Clock high time
TCKH
250
ns
Clock low time
TCKL
250
ns
Chip select setup time
TCSS
50
ns
Relative to CLK
Chip select hold time
TCSH
0
ns
Relative to CLK
Chip select low time
TCSL
250
ns
Data input setup time
TDIS
100
ns
Relative to CLK
Data input hold time
TDIH
100
ns
Relative to CLK
Data output delay time
TPD
400
ns
CL = 100 pF
Data output disable time
TCZ
100
ns
CL = 100 pF (Note 2)
Status valid time
TSV
500
ns
CL = 100 pF
Program cycle time
TWC
410
ms
Erase/Write mode
TEC
815
ms
ERAL mode (Vcc = 5V
± 10%)
TWL
16
30
ms
WRAL mode (Vcc = 5V
± 10%)
Endurance
—
1M
—
1M
—
25°C, Vcc = 5.0V, Block mode
Note 1:
This parameter is tested at TA = 25
°C and FCLK = 1 MHz.
2:
This parameter is periodically sampled and not 100% tested.
3:
This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance Model which can be obtained from Microchip’s web site.