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參數(shù)資料
| 型號(hào)： | 933795210602 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 計(jì)數(shù)器 |
| 英文描述： | F/FAST SERIES, SYN POSITIVE EDGE TRIGGERED 8-BIT BIDIRECTIONAL BINARY COUNTER, PDIP16 |
| 封裝： | PLASTIC, SOT-38-4, DIP-16 |
| 文件頁數(shù)： | 6/8頁 |
| 文件大?。?/td> | 110K |
| 代理商： | 933795210602 |
Philips Semiconductors
Product specification
74F779
8-bit bidirectional binary counter (3-State)
1989 Sep 20
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NO TAG
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
MIN
TYP
NO TAG
MAX
UNIT
TC
VCC = MIN,
VIL = MAX
IO = 1mA
±10%VCC
2.5
V
VO
High level output voltage
TC
VIL = MAX
VIH = MIN
IOH = –1mA
±5%VCC
2.7
3.4
V
VOH
High-level output voltage
I/On
VCC = MIN,
VIL = MAX
IO = 3mA
±10%VCC
2.4
V
I/On
VIL = MAX
VIH = MIN
IOH = –3mA
±5%VCC
2.7
3.3
V
VO
Low level output voltage
VCC = MIN,
VIL = MAX
IO = MAX
±10%VCC
0.30
0.50
V
VOL
Low-level output voltage
VIL = MAX
VIH = MIN
IOL = MAX
±5%VCC
0.35
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum
I/On
VCC = 5.5V, VI = 5.5V
1
mA
II
input voltage
others
VCC = 5.5V, VI = 7.0V
100
A
IIH
High-level input current
except
VCC = MAX, VI = 2.7V
20
A
IIL
Low-level input current
I/On
VCC = MAX, VI = 0.5V
–0.6
mA
IIH+IOZH
Off-state output current
High-level voltage applied
I/On
VCC = MAX, VO = 2.7V
70
A
IIL+IOZL
Off-state output current
Low-level voltage applied
I/On
VCC = MAX, VO = 0.5V
–600
A
IOS
Short-circuit output currentNO TAG
VCC = MAX
–60
–150
mA
ICCH
82
116
mA
ICC
Supply current (total)
ICCL
VCC = MAX
91
128
mA
ICCZ
97
136
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
Tamb = +25°C
VCC = +5V
CL = 50pF, RL = 500
Tamb = 0°C to +70°C
VCC = +5V ± 10%
CL = 50pF, RL = 500
UNIT
MIN
TYP
MAX
MIN
MAX
fMAX
Maximum clock frequency
Waveform 1
125
145
115
MHz
tPLH
tPHL
Propagation delay
CP to I/On
Waveform 1
4.5
5.5
7.0
8.0
10.5
4.5
5.5
11.0
ns
tPLH
tPHL
Propagation delay
CP to TC
Waveform 1
4.5
7.0
9.0
4.5
10.0
ns
tPLH
tPHL
Propagation delay
CET to TC
Waveform 2
3.0
4.5
5.5
6.5
7.5
2.5
7.5
8.0
ns
tPZH
tPZL
Output Enable time to
High or Low level
Waveform 4
Waveform 5
2.5
4.5
6.5
7.0
9.0
2.5
4.5
8.0
9.5
ns
tPHZ
tPLZ
Output Enable time from
High or Low level
Waveform 4
Waveform 5
1.0
3.0
4.0
6.5
7.0
1.0
8.0
ns
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