參數(shù)資料
型號(hào): 7AHCT373PWDH
廠商: NXP Semiconductors N.V.
英文描述: Replacement Sealed Beams, 4 in x 6 in [101,6 mm x 152,4 mm], Trapezoid Beam Pattern, 12 Vdc/50 W/4 A
中文描述: 八路D型透明鎖存器,三態(tài)
文件頁(yè)數(shù): 14/20頁(yè)
文件大小: 97K
代理商: 7AHCT373PWDH
1999 Nov 23
14
Philips Semiconductors
Product specification
Octal D-type transparent latch; 3-state
74AHC373; 74AHCT373
Fig.11 Test circuitry for switching times.
handbook, full pagewidth
open
GND
VCC
VCC
VI
VO
MNA183
D.U.T.
CL
RT
1000
PULSE
GENERATOR
S1
TEST
S1
t
PLH
/t
PHL
t
PLZ
/t
PZL
t
PHZ
/t
PZH
open
V
CC
GND
Definitions for test circuit.
C
L
= load capacitance including jig and probe capacitance (See Chapter “AC characteristics”).
R
T
= termination resistance should be equal to the output impedance Z
o
of the pulse generator.
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