MC7800, MC7800A, LM340, LM340A Series
8
MOTOROLA ANALOG IC DEVICE DATA
ELECTRICAL CHARACTERISTICS (continued)
(Vin = 19 V, IO = 500 mA, TJ = Tlow to Thigh [Note 1], unless otherwise noted.)
MC7812C/LM340T–12
Characteristic
Symbol
Min
Typ
Max
Unit
Output Noise Voltage (TA = 25
°
C)
10 Hz
≤
f
≤
100 kHz
Vn
–
10
–
μ
V/VO
Output Resistance f = 1.0 kHz
rO
ISC
–
1.1
–
m
Short Circuit Current Limit (TA = 25
°
C)
Vin = 35 Vdc
Peak Output Current (TJ = 25
°
C)
Average Temperature Coefficient of Output Voltage
–
0.2
–
A
Imax
TCVO
–
2.2
–
A
–
–0.8
–
mV/
°
C
ELECTRICAL CHARACTERISTICS
(Vin = 19 V, IO = 1.0 A, TJ = Tlow to Thigh [Note 1], unless otherwise noted.)
MC7812AC/LM340AT–12
Characteristic
Symbol
Typ
Max
Unit
Output Voltage (TJ = 25
°
C)
Output Voltage (5.0 mA
≤
IO
≤
1.0 A, PD
≤
15 W)
14.8 Vdc
≤
Vin
≤
27 Vdc
Line Regulation (Note 2)
14.8 Vdc
≤
Vin
≤
30 Vdc, IO = 500 mA
16 Vdc
≤
Vin
≤
22 Vdc, IO = 1.0 A
14.5 Vdc
≤
Vin
≤
27 Vdc, TJ = 25
°
C
Load Regulation (Note 2)
5.0 mA
≤
IO
≤
1.5 A, TJ = 25
°
C
5.0 mA
≤
IO
≤
1.0 A
Quiescent Current
VO
VO
11.75
12
12.25
Vdc
11.5
12
12.5
Vdc
Regline
mV
–
–
–
3.8
2.2
6.0
18
20
120
Regload
mV
–
–
–
–
25
25
IB
IB
–
3.4
6.0
mA
Quiescent Current Change
15 Vdc
≤
Vin
≤
30 Vdc, IO = 500 mA
14.8 Vdc
≤
Vin
≤
27 Vdc, TJ = 25
°
C
5.0 mA
≤
IO
≤
1.0 A, TJ = 25
°
C
Ripple Rejection
15 Vdc
≤
Vin
≤
25 Vdc, f = 120 Hz, IO = 500 mA
Dropout Voltage (IO = 1.0 A, TJ = 25
°
C)
Output Noise Voltage (TA = 25
°
C)
10 Hz
≤
f
≤
100 kHz
mA
–
–
–
–
–
–
0.8
0.8
0.5
RR
55
60
–
dB
VI – VO
Vn
–
2.0
–
Vdc
–
10
–
μ
V/VO
Output Resistance (f = 1.0 kHz)
rO
ISC
–
1.1
–
m
Short Circuit Current Limit (TA = 25
°
C)
Vin = 35 Vdc
Peak Output Current (TJ = 25
°
C)
Average Temperature Coefficient of Output Voltage
–
0.2
–
A
Imax
TCVO
–
2.2
–
A
–
–0.8
–
mV/
°
C
NOTES:
1.Tlow = –40
°
C for MC78XXAC, C, LM340AT–XX, LM340T–XX Thigh = +125
°
C for MC78XXAC, C, LM340AT–XX, LM340T–XX
2.Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account
separately. Pulse testing with low duty cycle is used.