參數(shù)資料
型號(hào): 74VHC00
廠商: Fairchild Semiconductor Corporation
英文描述: Quad 2-Input NAND Gate
中文描述: 四2輸入與非門
文件頁(yè)數(shù): 3/7頁(yè)
文件大?。?/td> 53K
代理商: 74VHC00
DC SPECIFICATIONS
Symbol
Parameter
Test Conditions
V
CC
(V)
Value
Unit
T
A
= 25
o
C
Min.
Typ.
1.5
0.7V
CC
-40 to 85
o
C
Min.
1.5
0.7V
CC
Max.
Max.
V
IH
High Level Input
Voltage
2.0
V
3.0 to 5.5
2.0
3.0 to 5.5
2.0
3.0
4.5
3.0
4.5
2.0
3.0
4.5
3.0
4.5
0 to 5.5
5.5
V
IL
Low Level Input
Voltage
0.5
0.5
V
0.3V
CC
0.3V
CC
V
OH
High Level Output
Voltage
I
O
=-50
μ
A
I
O
=-50
μ
A
I
O
=-50
μ
A
I
O
=-4 mA
I
O
=-8 mA
I
O
=50
μ
A
I
O
=50
μ
A
I
O
=50
μ
A
I
O
=4 mA
I
O
=8 mA
V
I
= 5.5V or GND
V
I
= V
CC
orGND
1.9
2.9
4.4
2.58
3.94
2.0
3.0
4.5
1.9
2.9
4.4
2.48
3.8
V
V
OL
Low Level Output
Voltage
0.0
0.0
0.0
0.1
0.1
0.1
0.36
0.36
±
0.1
2
0.1
0.1
0.1
0.44
0.44
±
1.0
20
V
I
I
Input Leakage Current
Quiescent Supply
Current
μ
A
μ
A
I
CC
CAPACITIVE CHARACTERISTICS
Symbol
Parameter
Test Conditions
Value
Unit
T
A
= 25
o
C
Min.
Typ.
-40 to 85
o
C
Min.
Max.
10
Max.
10
C
IN
C
PD
Input Capacitance
Power Dissipation
Capacitance (note 1)
4
pF
pF
19
1)C
PD
isdefined as thevalue oftheIC’sinternal equivalent capacitance whichiscalculated fromtheoperatingcurrent consumption without load.(Referto
TestCircuit).Average operatingcurrent canbeobtained bythefollowingequation.I
CC
(opr)=C
PD
V
CC
f
IN
+I
CC
/4(per Gate)
AC ELECTRICAL CHARACTERISTICS
(Inputt
r
= t
f
=3 ns)
Symbol
Parameter
Test Condition
C
L
(pF)
3.3
(*)
15
3.3
(*)
50
5.0
(**)
15
5.0
(**)
50
Value
Unit
V
CC
(V)
T
A
= 25
o
C
Min.
Typ.
-40 to 85
o
C
Min.
1.0
1.0
1.0
1.0
Max.
7.9
11.4
5.5
7.5
Max.
9.5
13.0
6.5
8.5
t
PLH
t
PHL
Propagation Delay
Time
5.5
8.0
3.7
5.2
ns
(*) Voltagerangeis3.3V
±
0.3V
(**) Voltagerange is 5V
±
0.5V
74VHC00
3/7
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
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74VHC00LCW WAF 制造商:Fairchild Semiconductor Corporation 功能描述:
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