參數資料
型號: 74LVC823A
廠商: NXP Semiconductors N.V.
英文描述: 9-bit D-type flip-flop with 5-volt tolerant inputs/outputs;positive-edge trigger(3-State)(帶5V輸入/輸出容限的上升沿觸發(fā)的9位D觸發(fā)器(三態(tài)))
中文描述: 9位D型觸發(fā)器5伏容限輸入/輸出;積極邊緣觸發(fā)(3態(tài))(帶5V的輸入/輸出容限的上升沿觸發(fā)的9位?觸發(fā)器(三態(tài)))
文件頁數: 5/12頁
文件大?。?/td> 106K
代理商: 74LVC823A
Philips Semiconductors
Product specification
74LVC823A
9-bit D-type flip-flop with 5-volt tolerant
inputs/outputs; positive-edge trigger (3-State)
1998 Sep 24
5
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
MIN
MAX
V
CC
DC supply voltage (for max. speed performance)
2.7
3.6
V
DC supply voltage (for low-voltage applications)
1.2
3.6
V
I
DC Input voltage range
0
5.5
V
V
DC output voltage range; output HIGH or LOW
state
0
V
CC
V
O
DC output voltage range; output 3-State
0
5.5
T
amb
Operating ambient temperature range in free-air
–40
+85
°
C
t
r
, t
f
Input rise and fall times
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS
1
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
I
IK
V
I
DC supply voltage
–0.5 to +6.5
V
DC input diode current
V
I
Note 2
0
–50
mA
DC input voltage
–0.5 to +6.5
V
I
OK
DC output diode current
V
O
V
CC
or V
O
0
50
mA
V
O
DC output voltage; output HIGH or LOW state
Note 2
–0.5 to V
CC
+0.5
–0.5 to 6.5
V
DC output voltage; output 3-State
Note 2
I
O
DC output source or sink current
V
O
= 0 to V
CC
50
mA
I
GND
, I
CC
DC V
CC
or GND current
100
mA
T
stg
Storage temperature range
–65 to +150
°
C
Power dissipation per package
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
P
TOT
above +70
°
C derate linearly with 8 mW/K
above +60
°
C derate linearly with 5.5 mW/K
500
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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