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參數(shù)資料
| 型號： | 74LVC00A |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Quad 2-input NAND gate(四2輸入與非門) |
| 中文描述： | 四2輸入與非門（四2輸入與非門） |
| 文件頁數(shù)： | 3/8頁 |
| 文件大小： | 86K |
| 代理商： | 74LVC00A |
Philips Semiconductors
Product specification
74LVC00A
Quad 2-input NAND gate
1998 Apr 28
3
LOGIC DIAGRAM (ONE GATE)
Y
A
B
SV00379
FUNCTION TABLE
INPUTS
OUTPUTS
nA
nB
nY
L
L
L
H
H
H
H
L
H
H
H
L
NOTES:
H =HIGH voltage level
L
=LOW voltage level
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
MIN
MAX
V
CC
DC supply voltage (for max. speed performance)
2.7
3.6
V
V
CC
DC supply voltage (for low-voltage applications)
1.2
3.6
V
V
I
DC Input voltage range
0
5.5
V
V
O
DC output voltage range
0
V
CC
V
T
amb
Operating ambient temperature range in free-air
–40
+85
°
C
t
r
, t
f
Input rise and fall times
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS
1
Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
DC supply voltage (for max. speed
performance)
–0.5 to +6.5
V
I
IK
V
I
I
OK
V
O
I
O
DC input diode current
V
I
Note 2
0
–50
mA
DC input voltage
–0.5 to +5.5
V
DC output diode current
V
O
Note 2
V
CC
or V
O
0
50
mA
DC output voltage
–0.5 to V
CC
+ 0.5
50
V
DC output source or sink current
V
O
= 0 to V
CC
mA
I
GND
, I
CC
T
stg
DC V
CC
or GND current
Storage temperature range
100
mA
–65 to +150
°
C
Power dissipation per package
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
P
TOT
above +70
°
C derate linearly with 8 mW/K
above +60
°
C derate linearly with 5.5 mW/K
500
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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