參數(shù)資料
型號： 74HCT1G66GW-T
廠商： NXP SEMICONDUCTORS
元件分類： 多路復用及模擬開關(guān)
英文描述： 1-CHANNEL, SGL POLE SGL THROW SWITCH, PDSO5
封裝： 1.25 MM, PLASTIC, SOT-353, MO-203, SC-88A, TSSOP-5
文件頁數(shù)： 14/18頁
文件大小： 107K
代理商： 74HCT1G66GW-T
74HC_HCT1G66_4
NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 — 19 December 2008
5 of 18
NXP Semiconductors
74HC1G66; 74HCT1G66
Single-pole single-throw analog switch
[1]
Typical values are measured at Tamb =25 °C.
10.1 Test circuits
74HCT1G66
VIH
HIGH-level input
voltage
VCC = 4.5 V to 5.5 V
2.0
1.6
-
2.0
-
V
VIL
LOW-level input
voltage
VCC = 4.5 V to 5.5 V
0.1
1.2
0.8
-
0.8
V
II
input leakage
current
E; VI =VCC or GND; VCC = 5.5 V
-
0.1
1.0
-
1.0
A
IS(OFF)
OFF-state leakage
current
Y or Z; VCC = 5.5 V; see Figure 4
-
0.1
1.0
-
1.0
A
IS(ON)
ON-state leakage
current
Y or Z; VCC = 5.5 V; see Figure 5
-
0.1
1.0
-
1.0
A
ICC
supply current
E, Y or Z; VI =VCC or GND;
VSW = GND or VCC;
VCC = 4.5 V to 5.5 V
-
1
10
-
20
A
ICC
additional supply
current
VI =VCC 2.1 V; VCC = 4.5 V to 5.5 V;
IO = 0 A
-
500
-
850
A
CI
input capacitance
-
1.5
-
pF
CS(ON)
ON-state
capacitance
-8-
-
pF
Table 7.
Static characteristics …continued
Voltages are referenced to GND (ground = 0 V).
Symbol Parameter
Conditions
40 °C to +85 °C
40 °C to +125 °C Unit
Min
Typ[1]
Max
Min
Max
VI = VCC or GND and VO = GND or VCC.VI = VCC or GND and VO = open circuit.
Fig 4.
Test circuit for measuring OFF-state
leakage current
Fig 5.
Test circuit for measuring ON-state
leakage current
001aag488
IS
VI
VIL
VO
VCC
GND
Y
Z
E
001aag489
IS
VI
VIH
VO
VCC
GND
Y
Z
E
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