參數(shù)資料
型號(hào)： 74F779
廠(chǎng)商： NXP Semiconductors N.V.
元件分類(lèi)： 通用總線(xiàn)功能
英文描述： 8-bit bidirectional binary counter (3-State)(8位雙向二進(jìn)制計(jì)數(shù)器（三態(tài)）)
中文描述： 8位雙向二進(jìn)制計(jì)數(shù)器（3態(tài)）（8位雙向二進(jìn)制計(jì)數(shù)器（三態(tài)））
文件頁(yè)數(shù)： 6/12頁(yè)
文件大?。?/td> 100K
代理商： 74F779
Philips Semiconductors
Product specification
74F779
8-bit bidirectional binary counter (3-State)
1989 Sep 20
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
NO TAG
MIN
TYP
NO TAG
MAX
UNIT
TC
V
CC
= MIN,
V
IL
= MAX
V
IH
= MIN
= 1mA
I
OH
= –1mA
±
10%V
CC
2.5
V
V
OH
High level output voltage
High-level output voltage
±
5%V
CC
2.7
3.4
V
I/On
V
CC
= MIN,
V
IL
= MAX
V
IH
= MIN
= 3mA
I
OH
= –3mA
±
10%V
CC
2.4
V
±
5%V
CC
2.7
3.3
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX
V
IH
= MIN
I
OL
= MAX
±
10%V
CC
0.30
0.50
V
±
5%V
CC
0.35
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= 5.5V, V
I
= 5.5V
V
CC
= 5.5V, V
I
= 7.0V
–0.73
–1.2
V
I
I
Input current at maximum
input voltage
I/On
1
mA
others
100
μ
A
I
IH
High-level input current
except
I/On
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low-level input current
V
CC
= MAX, V
I
= 0.5V
–0.6
mA
I
IH
+I
OZH
Off-state output current
High-level voltage applied
I/On
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
IL
+I
OZL
Off-state output current
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V
–600
μ
A
I
OS
Short-circuit output current
NO TAG
V
CC
= MAX
–60
–150
mA
I
CCH
82
116
mA
I
CC
Supply current (total)
I
CCL
V
CC
= MAX
91
128
mA
I
CCZ
97
136
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
= 5V, T
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
T
amb
= +25
°
C
V
CC
= +5V
C
L
= 50pF, R
L
= 500
MIN
TYP
T
amb
= 0
°
C to +70
°
C
V
CC
= +5V
±
10%
C
L
= 50pF, R
L
= 500
MIN
UNIT
MAX
MAX
f
MAX
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
Maximum clock frequency
Waveform 1
125
145
115
MHz
Propagation delay
CP to I/On
Waveform 1
4.5
5.5
7.0
8.0
10.5
10.5
4.5
5.5
11.0
11.0
ns
ns
Propagation delay
CP to TC
Waveform 1
4.5
4.5
7.0
7.0
9.0
9.0
4.5
4.5
10.0
10.0
ns
ns
Propagation delay
CET to TC
Waveform 2
3.0
3.0
4.5
5.5
6.5
7.5
2.5
2.5
7.5
8.0
ns
ns
Output Enable time to
High or Low level
Waveform 4
Waveform 5
2.5
4.5
4.5
6.5
7.0
9.0
2.5
4.5
8.0
9.5
ns
ns
Output Enable time from
High or Low level
Waveform 4
Waveform 5
1.0
1.0
3.0
4.0
6.5
7.0
1.0
1.0
8.0
8.0
ns
ns
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參數(shù)描述
74F779 WAF 制造商:Rochester Electronics LLC 功能描述:
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74F779PCQR 制造商:NSC 制造商全稱(chēng):National Semiconductor 功能描述:8-Bit Bidirectional Binary Counter with TRI-STATE Outputs
74F779SC 功能描述:計(jì)數(shù)器 IC 8-Bit Bidir Bin Ctr RoHS:否 制造商:NXP Semiconductors 計(jì)數(shù)器類(lèi)型:Binary Counters 邏輯系列:74LV 位數(shù):10 計(jì)數(shù)法: 計(jì)數(shù)順序: 工作電源電壓:1 V to 5.5 V 工作溫度范圍:- 40 C to + 125 C 封裝 / 箱體:SOT-109 封裝:Reel
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