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參數(shù)資料
| 型號： | 74F712A |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Multiplexers |
| 中文描述： | 多路復(fù)用器 |
| 文件頁數(shù)： | 7/16頁 |
| 文件大小： | 132K |
| 代理商： | 74F712A |
Philips Semiconductors
Product specification
74F711A/74F711–1/
74F712A/74F712–1
Multiplexers
1990 Dec 13
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
= 3mA
I
OH
= –3mA
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.4
V
V
OH
High level output voltage
High-level output voltage
V
CC
= MIN,
V
IL
= MAX
V
= MIN
IH
2.7
3.4
V
= 15mA
I
OH
= –15mA
2.0
V
2.0
V
74F711A/
74F712A
only
I
OL
= MAX
±
10%V
CC
0.38
0.55
V
V
OL
Low-level output voltage
V
CC
= MIN,
V
= MAX,
IL
V
IH
= MIN
±
5%V
CC
0.42
0.55
V
74F711-1/
74F712-1
,
I
OL
= 5mA
±
10%V
CC
0.38
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum input
voltage
V
CC
= MAX, V
I
= 7.0V
100
μ
A
I
IH
High-level input current
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low level input current
Low-level input current
Others
V
CC
= MAX V = 0 5V
I
= 0.5V
–20
μ
A
μ
A
Dn only
–40
I
OZH
Off-state output current
High-level voltage
applied
74F711A/
74F711 1
74F711-1
only
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
Off-state output current
Low-level voltage
applied
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
Short-circuit output
current
3
74F711-1/
74F712-1
V
CC
= MAX
–60
–150
mA
I
O
Output current
4
74F711A/
74F712A
V
CC
= MAX, V
O
= 2.25 V
–60
–150
mA
I
CCH
I
CCL
I
CCZ
I
CCH
I
CCL
I
CCZ
I
CCH
I
CCL
I
CCH
I
CCL
25
35
mA
74F711A
V
CC
= MAX
33
46
mA
27
40
mA
26
40
mA
I
CC
Supply
current
(total)
74F711-1
V
CC
= MAX
33
45
mA
28
45
mA
74F712A
V
CC
= MAX
20
27
mA
30
40
mA
74F712 1
74F712-1
V
CC
= MAX
20
30
mA
29
40
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. I
O
is tested under conditions that produce current approximity one half of the true short-circuit output current (I
OS
).
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