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| 型號(hào)： | 74F579SJ |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | 8-Bit Bidirectional Binary Counter with 3-STATE Outputs |
| 中文描述： | F/FAST SERIES, SYN POSITIVE EDGE TRIGGERED 8-BIT BIDIRECTIONAL BINARY COUNTER, PDSO20 |
| 封裝： | 5.30 MM, EIAJ TYPE2, SOP-20 |
| 文件頁(yè)數(shù)： | 6/14頁(yè) |
| 文件大?。?/td> | 112K |
| 代理商： | 74F579SJ |
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Philips Semiconductors
Product specification
74F579
8-bit bidirectional binary counter (3-State)
1992 May 04
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
TC
V
CC
= MIN,
V
IL
= MAX,
V
= MIN
IH
(V
IL
= 0.0V,
= 4 5V
V
IH
= 4.5V
for MR, CP inputs)
= 1mA
I
OH
= –1mA
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.5
V
V
OH
High level output voltage
High-level output voltage
2.7
3.4
V
I/O
n
= 3mA
I
OH
= –3mA
2.4
3.3
V
2.7
3.3
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX
V
IH
= MIN
I
OL
= MAX,
±
10%V
CC
0.35
0.50
V
±
5%V
CC
0.35
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 5.5V
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
–0.73
–1.2
V
I
I
Input current
at maximum input voltage
I/O
n
others
1
mA
μ
A
μ
A
100
I
IH
High-level input current
except
I/O
n
20
I
IL
Low-level input current
Off-state output current
High-level voltage applied
Off-state output current
Low-level voltage applied
Short-circuit output current
3
V
CC
= MAX, V
I
= 0.5V
–0.6
mA
I
OZH
+ I
IH
I/O
n
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
OZL
+ I
IL
V
CC
= MAX, V
O
= 0.5V
–600
μ
A
I
OS
V
CC
= MAX
–60
–150
mA
I
CCH
I
CCL
I
CCZ
95
135
mA
I
CC
Supply current (total)
V
CC
= MAX
105
145
mA
105
150
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under Recommended Operating Conditions for the applicable
type.
2. All typical values are at V
= 5V, T
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter test, I
OS
tests should be performed last.
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