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參數資料
| 型號： | 74F524SCX |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Magnitude Comparator |
| 中文描述： | F/FAST SERIES, 8-BIT MAGNITUDE COMPARATOR, TRUE OUTPUT, PDSO20 |
| 封裝： | 0.300 INCH, MS-013, SOIC-20 |
| 文件頁數： | 7/14頁 |
| 文件大?。?/td> | 131K |
| 代理商： | 74F524SCX |
Philips Semiconductors
Product specification
74F524
8-bit register comparator (open collector + 3-State)
1990 Aug 07
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
NO TAG
LIMITS
TYP
2
UNIT
MIN
MAX
I
OH
High-level output current
LT, EQ, GT
only
V
CC
= MIN, V
IL
= MAX,
V
IH
= MIN, V
OH
= MAX
250
μ
A
C/SO only
CC
V
= MIN,
V
IL
= MAX,
V
IH
= MIN
±
10%V
CC
2.5
V
V
OH
High-level output voltage
I/On only
I
OH
=MAX
±
10%V
CC
2.4
V
±
5%V
CC
2.7
3.4
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
I
OL
= MAX
±
10%V
CC
0.35
0.50
V
±
5%V
CC
0.35
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 5.5V
V
CC
= MAX, V
I
= 7.0V
–0.73
–1.2
V
I
I
Input current at maximum
input voltage
I/On
1
mA
Except I/On
100
μ
A
I
IH
High-level input current
Except I/On
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low-level input current
V
CC
= MAX, V
I
= 0.5V
–0.6
mA
I
OZH
Off-state output current
High-level voltage applied
I/On only
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
OZL
Off-state output current
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V
–0.6
mA
I
OS
Short-circuit output
current
3
Except LT,
EQ, GT
V
CC
= MAX
–60
–150
mA
I
CC
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
= 5V, T
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
Supply current (total)
V
CC
= MAX
110
150
mA
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