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參數(shù)資料
| 型號(hào)： | 74F40 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Dual 4-input NAND buffer |
| 中文描述： | 雙路4輸入與非緩沖 |
| 文件頁數(shù)： | 2/3頁 |
| 文件大?。?/td> | 34K |
| 代理商： | 74F40 |
Philips Semiconductors FAST Products
Product specification
74F40
Dual 4-input NAND buffer
April 11, 1989
2
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V
CC
Supply voltage
–0.5 to +7.0
V
V
IN
Input voltage
–0.5 to +7.0
V
I
IN
Input current
–30 to +5
mA
V
OUT
Voltage applied to output in High output state
–0.5 to V
CC
V
I
OUT
Current applied to output in Low output state
128
mA
T
amb
Operating free-air temperature range
0 to +70
°
C
T
stg
Storage temperature range
–65 to +150
°
C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
V
CC
Supply voltage
4.5
5.0
5.5
V
V
IH
High-level input voltage
2.0
V
V
IL
Low-level input voltage
0.8
V
I
IK
Input clamp current
–18
mA
I
OH
High-level output current
–15
mA
I
OL
Low-level output current
64
mA
T
amb
Operating free-air temperature range
0
+70
°
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
V
OH
High-level output voltage
V
IH
= MIN
I
= –1mA
OH
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.5
V
V
CC
= MIN,
V
IL
= MAX,
2.7
3.4
I
OH
= –15mA
2.0
V
2.0
V
OL
Low-level output voltage
V
CC
= MIN,
V
IH
= MIN
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
V
CC
= MAX
I
OL
= MAX
±
10%V
CC
0.55
V
V
IL
= MAX,
±
5%V
CC
0.42
0.55
V
IK
I
I
I
IH
I
IL
I
OS
Input clamp voltage
–0.73
–1.2
V
μ
A
Input current at maximum input voltage
100
High-level input current
20
μ
A
Low-level input current
Short-circuit output current
3
–0.6
mA
–100
–225
mA
I
CC
Supply current (total)
I
CCH
I
CCL
V
CC
= MAX
V
IN
= GND
V
IN
= 4.5V
1.75
4.0
mA
11
17
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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