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參數(shù)資料
| 型號(hào)： | 74F323PC |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Octal Universal Shift/Storage Register with Synchronous Reset and Common I/O Pins |
| 中文描述： | F/FAST SERIES, 8-BIT BIDIRECTIONAL PARALLEL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, PDIP20 |
| 封裝： | 0.300 INCH, PLASTIC, MS-001, DIP-20 |
| 文件頁(yè)數(shù)： | 5/7頁(yè) |
| 文件大小： | 73K |
| 代理商： | 74F323PC |
Philips Semiconductors
Product specification
74F323
8-bit universal shift/storage register with synchronous
reset and common I/O pins (3-State)
1990 Mar 01
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
V
OH
High-level output voltage
Q0, Q7
V
IH
= MIN
I
OH
= –1mA
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.5
V
V
CC
= MIN,
V
IL
= MAX,
2.7
3.4
V
I/On
I
OH
= –3mA
2.5
V
2.7
3.4
V
V
OL
Low-level output voltage
V
CC
= MIN,
V
IH
= MIN
I
OL
= MAX
±
10%V
CC
0.35
0.50
V
V
IL
= MAX,
±
5%V
CC
0.35
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= 5.5V, V
I
= 5.5V
–0.73
–1.2
V
I
I
maximum input voltage
others
100
μ
A
Input current at
I/On
1
mA
I
IH
High-level input current
except
I/On
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low-level input current
S0, S1
V
CC
= MAX, V
I
= 0.5V
–1.2
mA
others
–0.6
mA
I
IH +
I
OZH
Off-state output current,
High-level voltage
applied
I/On
only
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
IL +
I
OZL
Off-state output current
Low-level voltage applied
Short-circuit output current
3
V
CC
= MAX, V
O
= 0.5V
–0.6
mA
I
OS
V
CC
= MAX
–60
–150
mA
I
CCH
I
CCL
I
CCZ
V
55
75
mA
I
CC
Supply current (total)
65
90
mA
CC
= MAX
55
85
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
=+ 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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| 74F323SC | 制造商:FAIRCHILD 制造商全稱:Fairchild Semiconductor 功能描述:Octal Universal Shift/Storage Register with Synchronous Reset and Common I/O Pins |
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