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參數(shù)資料
| 型號(hào)： | 74F280 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | 9-bit odd/even parity generator/checker |
| 中文描述： | 9位奇/偶校驗(yàn)發(fā)生器/檢查 |
| 文件頁數(shù)： | 4/8頁 |
| 文件大小： | 106K |
| 代理商： | 74F280 |
Philips Semiconductors
Product specification
74F280B
9-bit odd/even parity generator/checker
1996 Mar 12
4
ABSOLUTE MAXIMUM RATINGS
SYMBOL
PARAMETER
RATING
UNIT
V
CC
V
IN
I
IN
V
OUT
I
OUT
Supply voltage
–0.5 to +7.0
V
Input voltage
–0.5 to +7.0
V
Input current
–30 to +5
mA
Voltage applied to output in High output state
–0.5 to V
CC
40
V
Current applied to output in Low output state
mA
T
amb
Operating free air temperature range
Operating free-air temperature range
Commercial range
0 to +70
°
C
°
C
Industrial range
–40 to +85
T
stg
Storage temperature
–65 to +150
°
C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
Nom
UNIT
Min
Max
V
CC
V
IH
V
IL
I
IK
Supply voltage
4.5
5.0
5.5
V
High-level input voltage
2.0
V
Low-level input voltage
0.8
V
Input clamp current
–18
mA
I
OH
I
OL
High-level output current
–1
mA
Low-level output current
20
mA
T
amb
Operating free air temperature range
Operating free-air temperature range
Commercial range
0
70
°
C
°
C
Industrial range
–40
85
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
V
OH
High level output voltage
High-level output voltage
V
CC
= MIN, V
IL
= MAX
±
10%V
CC
2.5
V
V
IH
= MIN, I
OH
= MAX
±
5%V
CC
2.7
3.4
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN, V
IL
= MAX
±
10%V
CC
0.35
0.50
V
V
IH
= MIN, I
OL
= MAX
±
5%V
CC
0.35
0.50
V
IK
I
I
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= 0.0V, V
I
= 7.0V
–0.73
–1.2
V
Input current at maximum input voltage
100
μ
A
I
IH
High level input current
High-level input current
Commercial range
V
CC
= MAX V = 2 7V
I
= 2.7V
20
μ
A
Industrial range
40
μ
A
I
IL
Low-level input current
V
CC
= MAX, V
I
= 0.5V
–20
μ
A
I
OS
Short-circuit output current
3
V
CC
= MAX
–60
–150
mA
I
CC
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
Supply current (total)
V
CC
= MAX
26
35
mA
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