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Philips Semiconductors
Product specification
74F27
Triple 3-input NOR gate
February 5, 1991
4
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
V
OH
High-level output voltage
V
CC
= MIN, V
IL
= MAX
V
IH
= MIN, I
OH
= MAX
V
CC
= MIN, V
IL
= MAX
V
IH
= MIN, I
Ol
= MAX
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
V
CC
= MAX
V
CC
= MAX
V
CC
= MAX
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.5
V
2.7
3.4
V
V
OL
Low-level output voltage
0.30
0.50
V
0.30
0.50
V
V
IK
I
I
I
IH
I
IL
I
OS
I
CC
Input clamp voltage
-0.73
-1.2
V
Input current at maximum input voltage
100
μ
A
μ
A
High–level input current
20
Low–level input current
Short-circuit output current
3
-0.6
mA
-60
-150
mA
Supply current (total)
I
CCH
I
CCL
V
IN
= GND
V
IN
= 4.5V
4.0
5.5
mA
8.5
12.0
mA
NOTES:
1
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2
All typical values are at V
= 5V, T
= 25
°
C.
3
Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
V
CC
= +5.0V
T
= +25
°
C
C
L
= 50pF, R
L
= 500
V
CC
= +5.0V
±
10%
T
amb
= 0
°
C to +70
°
C
C
L
L
= 500
V
CC
= +5.0V
±
10%
T
amb
= –40
°
C to +85
°
C
C
L
= 50pF, R
L
= 500
UNIT
MIN
TYP
MAX
MIN
MAX
MIN
MAX
t
PLH
t
PHL
Propagation delay
Dna, Dnb, Dnc to Qn
Waveform 1
2.0
1.0
3.5
2.5
5.0
4.5
1.5
1.0
5.5
4.5
1.0
1.0
7.0
5.5
ns