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參數(shù)資料
| 型號： | 74F253 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Dual 4-bit input multiplexer (3-State)(雙4位輸入多路復(fù)用器（三態(tài)）) |
| 中文描述： | 雙4位輸入多路復(fù)用器（3態(tài)）（雙4位輸入多路復(fù)用器（三態(tài)）） |
| 文件頁數(shù)： | 5/10頁 |
| 文件大?。?/td> | 80K |
| 代理商： | 74F253 |
Philips Semiconductors
Product specification
74F253
Dual 4-input multiplexer (3-State)
1988 Nov 29
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
NO TAG
MIN
TYP
NO TAG
MAX
UNIT
V
OH
High level output voltage
High-level output voltage
V
= MIN, V
= MAX,
CC
V
IH
= MIN, I
OH
= MAX
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.4
V
IL
2.7
3.3
V
V
OL
Low level output voltage
Low-level output voltage
V
= MIN, V
= MAX,
CC
V
IH
= MIN, I
OL
= MAX
0.35
0.50
V
IL
,
0.35
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum input
voltage
V
CC
= MAX, V
I
= 7.0V
100
μ
A
I
IH
I
IL
High-level input current
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
20
μ
A
Low-level input current
–0.6
mA
I
OZH
Off-state output current
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
Off-state output current
Low-level voltage applied
Short-circuit output current
NO TAG
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
V
CC
= MAX
–60
–150
mA
I
CCH
I
CCL
I
CCZ
OEn=GND, Sn=In=4.5V
10
16
mA
I
CC
Supply current (total)
V
CC
= MAX
OEn=Sn=In=GND
12
23
mA
OEn=4.5V, Sn=In=GND
14
23
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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