![](http://datasheet.mmic.net.cn/230000/74F251A_datasheet_15563207/74F251A_3.png)
Philips Semiconductors
Product specification
74F251A
8-input multiplexer (3-State)
1996 Jan 05
3
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V
CC
V
IN
I
IN
V
OUT
I
OUT
T
amb
T
stg
Supply voltage
–0.5 to +7.0
V
Input voltage
–0.5 to +7.0
V
Input current
–30 to +5
mA
Voltage applied to output in High output state
–0.5 to V
CC
48
V
Current applied to output in Low output state
mA
°
C
°
C
Operating free-air temperature range
0 to +70
Storage temperature
–65 to +150
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
NOM
UNIT
MIN
MAX
V
CC
V
IH
V
IL
I
IK
I
OH
I
OL
T
amb
Supply voltage
4.5
5.0
5.5
V
High-level input voltage
2.0
V
Low-level input voltage
0.8
V
Input clamp current
–18
mA
High-level output current
–3
mA
Low-level output current
24
mA
°
C
Operating free-air temperature range
0
70
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
V
OH
High-level output voltage
= MIN, V
= MAX,
V
CC
MIN, V
IL
MAX,
V
IH
= MIN, I
OH
= MAX
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.4
V
2.7
3.3
V
V
OL
Low-level output voltage
= MIN, V
= MAX,
V
CC
MIN, V
IL
MAX,
V
IH
= MIN, I
OL
= MAX
0.35
0.50
V
0.35
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum input
voltage
V
CC
= MAX, V
I
= 7.0V
100
μ
A
I
IH
I
IL
High-level input current
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
20
μ
A
mA
Low-level input current
–0.6
I
OZH
Off-state output current
High-level voltage applied
V
CC
= MAX, V
I
= 2.7V
50
μ
A
I
OZL
Off-state output current
Low-level voltage applied
Short-circuit output current
3
V
CC
= MAX, V
I
= 0.5V
–50
mA
I
OS
V
CC
= MAX
–60
–150
mA
I
CC
S
pp y
l
(
l)
I
CCH
I
CCL
I
CCZ
V
= MAX
CC
20
27
mA
17
24
mA
21
29
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.