參數(shù)資料
型號: 74F245
廠商: Fairchild Semiconductor Corporation
英文描述: Octal Bidirectional Transceiver with 3-STATE Outputs
中文描述: 八路雙向收發(fā)器三態(tài)輸出
文件頁數(shù): 4/10頁
文件大?。?/td> 91K
代理商: 74F245
Philips Semiconductors
Product specification
74F245
Octal transceiver (3-State)
November 15, 1994
4
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
A0 A7 B0 B7
A0–A7, B0–B7
= 3mA
I
OH
= –3mA
±
10% V
CC
2.4
V
V
OH
High level output voltage
High-level output voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
±
5% V
CC
2.7
3.4
V
B0 B7
B0–B7
= 15mA
I
OH
= –15mA
±
10% V
CC
2.0
V
±
5% V
CC
2.0
V
A0 A7
A0–A7
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
I
OL
= 20mA
±
10% V
CC
0.30
0.50
V
V
OL
Low-level output voltage
I
OL
= 24mA
±
5% V
CC
0.35
0.50
V
B0–B7
I
OL
= MAX
±
10% V
CC
0.55
V
V
OL
Low-level output voltage
B0–B7
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
I
OL
= MAX
±
5% V
CC
0.42
0.55
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum
input voltage
OE, T/R
V
CC
= 5.5V, V
I
= 7.0V
100
μ
A
A0–A7, B0–B7
V
CC
= 5.5V, V
I
= 5.5V
1
mA
I
IH
High-level input current
OE, T/R only
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low-level input current
OE, T/R only
V
CC
= MAX, V
I
= 0.5V
–1.2
mA
I
IH
+I
OZH
Off-state output current
High level voltage applied
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
IL
+I
OZL
Off-state output current
Low level voltage applied
V
CC
= MAX, V
O
= 0.5V
–600
μ
A
I
OS
Short circuit output current
Short-circuit output current
3
A0–A7
V
CC
= MAX
–60
–150
mA
B0–B7
–100
–225
mA
I
CCH
60
87
mA
I
CC
Supply current (total)
I
CCL
V
CC
= MAX
70
100
mA
I
CCZ
75
110
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
V
CC
= +5.0V
T
= +25
°
C
C
L
= 50pF, R
L
= 500
V
CC
= +5.0V
±
10%
T
amb
= 0
°
C to +70
°
C
C
L
L
= 500
UNIT
MIN
TYP
MAX
MIN
MAX
t
PLH
t
PHL
Propagation delay
An to Bn, Bn to An
Waveform 1
2.5
2.5
3.5
4.0
6.0
6.0
2.5
2.5
7.0
7.0
ns
t
PZH
t
PZL
Output Enable time
to High or Low level
Waveform 2
Waveform 3
2.0
3.5
4.5
5.5
7.0
8.0
2.0
3.5
8.0
9.0
ns
t
PHZ
t
PLZ
Output Disable time
from High or Low level
Waveform 2
Waveform 3
2.5
1.0
5.0
3.5
6.5
6.0
2.0
1.0
7.5
7.0
ns
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