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74AHC_AHCT1G66_4
NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 04 — 18 December 2008
10 of 17
NXP Semiconductors
74AHC1G66; 74AHCT1G66
Single-pole single-throw analog switch
11.2 Additional dynamic characteristics
Denitions for test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Fig 10. Test circuit for measuring switching times
VM
tW
10 %
90 %
0 V
VI
negative
pulse
positive
pulse
0 V
VM
90 %
10 %
tf
tr
tf
001aad983
DUT
VCC
VI
VO
RT
RL
S1
CL
open
G
Table 11.
Test data
Type
Input
Load
S1 position
VI
tr, tf
CL
RL
tPHL, tPLH
tPZH, tPHZ
tPZL, tPLZ
GND to VCC
3 ns
15 pF, 50 pF
1 k
open
GND
VCC
74AHCT1G66
GND to 3 V
3 ns
15 pF, 50 pF
1 k
open
GND
VCC
Table 12.
Additional dynamic characteristics for 74AHC1G66 and 74AHCT1G66
GND = 0 V; tr = tf = 3.0 ns; CL = 50 pF; unless otherwise specied. All typical values are measured at Tamb =25 °C.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
THD
total harmonic
distortion
VCC = 3.0 V to 3.6 V
-
0.025
-
%
VCC = 4.5 V to 5.5 V
-
0.015
-
%
VCC = 3.0 V to 3.6 V; VI = 2.5 V
-
0.025
-
%
VCC = 4.5 V to 5.5 V; VI = 4.0 V
-
0.015
-
%