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參數(shù)資料
| 型號(hào)： | 74AC11592 |
| 廠商： | Texas Instruments, Inc. |
| 元件分類： | 通用總線功能 |
| 英文描述： | 8-Bit Binary Counters With Input Register(8位二進(jìn)制計(jì)數(shù)器(帶輸入寄存器)) |
| 中文描述： | 隨著輸入寄存器8位二進(jìn)制計(jì)數(shù)器（8位二進(jìn)制計(jì)數(shù)器（帶輸入寄存器）） |
| 文件頁(yè)數(shù)： | 5/9頁(yè) |
| 文件大?。?/td> | 191K |
| 代理商： | 74AC11592 |
54AC11592, 74AC11592
8-BIT BINARY COUNTERS
WITH INPUT REGISTERS
APRIL 1992
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS
77251–1443
5
recommended operating conditions (see Note 2)
54AC11592
MIN
NOM
3
2.1
3.15
3.85
74AC11592
MIN
NOM
3
2.1
3.15
3.85
UNIT
MAX
5.5
MAX
5.5
VCC
Supply voltage
5
5
V
VCC = 3 V
VCC = 4.5 V
VCC = 5.5 V
VCC = 3 V
VCC = 4.5 V
VCC = 5.5 V
VIH
High-level input voltage
V
0.9
1.35
1.65
VCC
VCC
– 4
–24
–24
12
24
24
10
125
0.9
1.35
1.65
VCC
VCC
– 4
–24
–24
12
24
24
10
85
VIL
Low-level input voltage
V
VI
VO
Input voltage
Output voltage
0
0
0
0
V
V
VCC = 3 V
VCC = 4.5 V
VCC = 5.5 V
VCC = 3 V
VCC = 4.5 V
VCC = 5.5 V
IOH
High-level output current
mA
IOL
Low-level output current
mA
t/
v
TA
NOTE 2: Unused or floating inputs must be held high or low.
Input transition rise or fall rate
Operating free-air temperature
0
0
ns/V
°
C
– 55
–40
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
TA = 25
°
C
TYP
54AC11592
MIN
2.9
4.4
5.4
2.4
3.7
4.7
3.85
74AC11592
MIN
2.9
4.4
5.4
2.48
3.8
4.8
UNIT
MIN
2.9
4.4
5.4
2.58
3.94
4.94
MAX
MAX
MAX
VOH
3 V
V
IOH = – 50
μ
A
4.5 V
5.5 V
3 V
4.5 V
5.5 V
5.5 V
5.5 V
3 V
4.5 V
IOH = – 4 mA
IOL = – 24 mA
IOL = – 24 mA
IOH = – 50 mA
IOH = –75 mA
3.85
VOL
0.1
0.1
0.1
0.1
0.1
0.1
V
IOL = 50
μ
A
5.5 V
3 V
4.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5 V
0.1
0.36
0.36
0.36
0.1
0.5
0.5
0.5
1.65
0.1
0.44
0.44
0.44
IOL = 12 mA
IOL= 24 mA
IOL = 24 mA
IOL = 50 mA
IOL = 75 mA
VI = VCC or GND
VO = VCC or GND
VI = VCC or GND,
VI = VCC or GND
1.65
±
1
±
5
80
II
IOZ
ICC
Ci
±
0.1
±
0.5
±
1
μ
A
μ
A
μ
A
pF
±
10
160
IO = 0
8
4.5
Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.
P
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