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參數資料
| 型號： | 71V25781YSA166BGI |
| 廠商： | INTEGRATED DEVICE TECHNOLOGY INC |
| 元件分類： | SRAM |
| 英文描述： | 256K X 18 CACHE SRAM, 3.5 ns, PBGA119 |
| 封裝： | BGA-119 |
| 文件頁數： | 11/22頁 |
| 文件大小： | 627K |
| 代理商： | 71V25781YSA166BGI |
6.42
IDT71V25761, IDT71V25781, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
19
JTAG Interface Specification (SA Version only)
TCK
Device Inputs(1)/
TDI/TMS
Device Outputs(2)/
TDO
TRST(3)
tJCD
tJDC
tJRST
tJS
tJH
tJCYC
tJRSR
tJF
tJCL
tJR
tJCH
M5297 drw 01
x
Symbol
Parameter
Min.
Max.
Units
tJCYC
JTAG Clock Input Period
100
____
ns
tJCH
JTAG Clock HIGH
40
____
ns
tJCL
JTAG Clock Low
40
____
ns
tJR
JTAG Clock Rise Time
____
5(1)
ns
tJF
JTAG Clock Fall Time
____
5(1)
ns
tJRST
JTAG Reset
50
____
ns
tJRSR
JTAG Reset Recovery
50
____
ns
tJCD
JTAG Data Output
____
20
ns
tJDC
JTAG Data Output Hold
0
____
ns
tJS
JTAG Setup
25
____
ns
tJH
JTAG Hold
25
____
ns
I5297 tbl 01
Register Name
Bit Size
Instruction (IR)
4
Bypass (BYR)
1
JTAG Identification (JIDR)
32
Boundary Scan (BSR)
Note (1)
I5297 tbl 03
NOTES:
1. Device inputs = All device inputs except TDI, TMS and
TRST.
2. Device outputs = All device outputs except TDO.
3. During power up,
TRST could be driven low or not be used since the JTAG circuit resets automatically. TRST is an optional JTAG reset.
NOTE:
1. The Boundary Scan Descriptive Language (BSDL) file for this device is available
by contacting your local IDT sales representative.
JTAG AC Electrical
Characteristics(1,2,3,4)
Scan Register Sizes
NOTES:
1. Guaranteed by design.
2. AC Test Load (Fig. 1) on external output signals.
3. Refer to AC Test Conditions stated earlier in this document.
4. JTAG operations occur at one speed (10MHz). The base device may run at any speed specified in this datasheet.
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