參數資料
型號: 5962R9172201V2A
廠商: NATIONAL SEMICONDUCTOR CORP
元件分類: 計數器
英文描述: ACT SERIES, SYN POSITIVE EDGE TRIGGERED 4-BIT UP BINARY COUNTER, CQCC20
封裝: CERAMIC, LCC-20
文件頁數: 8/9頁
文件大小: 25K
代理商: 5962R9172201V2A
MV54ACT161-X REV 1A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS(Continued)
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC:
CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0nS, Temp Range: -55C to 125C.
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
tw(L)(3)
Pulse Width
(LOW)
VCC=4.5V
6, 8 MR
5.0
ns
9, 11
6, 8 MR
6.5
ns
10
ts(H/L)(1)
Setup Time
(HIGH or LOW)
VCC=4.5V
6, 8 Pn to
CP
9.5
ns
9, 11
6, 8 Pn to
CP
13.0
ns
10
th(H/L)(1)
Hold Time (HIGH
or LOW)
VCC=4.5V
6, 8 Pn to
CP
0.0
ns
9, 10,
11
ts(H/L)(2)
Setup Time
(HIGH or LOW)
VCC=4.5V
6, 8 PE to
CP
8.5
ns
9, 11
6, 8 PE to
CP
11.0
ns
10
th(H/L)(2)
Hold Time (HIGH
or LOW)
VCC=4.5V
6, 8 PE to
CP
0.0
ns
9, 10,
11
ts(H/L)(3)
Setup Time
(HIGH
or LOW)
VCC=4.5V
6, 8 CET or
CEP to
CP
5.5
ns
9, 11
6, 8 CET or
CEP to
CP
7.0
ns
10
th(H/L)(3)
Hold Time (HIGH
or LOW)
VCC=4.5V
6, 8 CET or
CEP to
CP
0.5
ns
9, 10,
11
TREC(1)
Recovery Time
6, 8 MR to
CP
0.0
ns
9, 11
6, 8 MR to
CP
0.5
ns
10
Note 1:
SCREEN TESTED 100% ON EACH DEVICE AT +25C & +125C TEMPERATURE, SUBGROUPS 1, 2, 7, &
8.
Note 2:
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C & +125C TEMP SUBGROUPS
A1, 2, 7 & 8.
Note 3:
SCREEN TESTED 100% ON EACH DEVICE AT +25C TEMPERATURE ONLY, SUBGROUP A9.
Note 4:
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C, & -55C
TEMPERATURE, SUBGROUPS A9, 10, & 11.
Note 5:
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C, & -55C
TEMPERATURE, SUBGROUPS A1, 2, 3, 7, & 8.
Note 6:
DESIGN CHARACTERIZATION DATA ONLY.
Note 7:
+25C & +125C MIN LIMITS GUARANTEED FOR 5.5V BY GUARDBANDING 4.5V MINIMUM LIMITS.
Note 8:
GENERAL NOTE:
DUE TO THE INTERNAL NOISE PROBLEMS THIS COMPONENT CANNOT MEET THE
THRESHOLD LIMITS REQUIRED PER MIL-STD-883, TEST METHOD 5005, FOR VIH (VIH=2.0V +20
PERCENT).
FOR FUNTIONAL TESTS, USE VIH=3.0V + 5 PERCENT FOR ALL INPUTS.
THE VIL
LIMIT (0.8V - 50 PERCENT) REMAINS UNCHANGED.
USERS ARE CAUTIONED TO VERIFY THAT THIS
CHANGE WILL NOT AFFECT THEIR SYSTEMS.
Note 9:
TRANSMISSION LINE DRIVING TEST, GUARDBANDED LIMITS SET FOR +25 C, 2 MSEC DURATION
MAX.
Note 10:
SCREEN TESTED 100% ON EACH DEVICE AT +25C TEMPERATURE ONLY, SUBGROUP A1.
Note 11:
SAMPLE TESTED (METHOD 5005, TABLE 1) AT +25C TEMPERATURE ONLY, SUBGROUP A1.
8
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