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參數(shù)資料
| 型號(hào)： | 5962R0052701KXC |
| 廠商： | CRANE ELECTRONICS INC |
| 元件分類： | 電源模塊 |
| 英文描述： | 1-OUTPUT 1.5 W DC-DC REG PWR SUPPLY MODULE |
| 封裝： | HERMETIC SEALED, METAL PACKAGE-7 |
| 文件頁(yè)數(shù)： | 9/10頁(yè) |
| 文件大?。?/td> | 576K |
| 代理商： | 5962R0052701KXC |
Class H and K, MIl-PRF-38534 ElEMEnt EvaluatIon
COmpOnent-level test
perfOrmed
spaCe prOtOtype (O)
nOn-Qml1
Class h
Qml
Class K
Qml
m/s2
p3
m/s2
p3
m/s2
p3
Element Electrical
yes
no
yes
Element Visual
no
yes
Internal Visual
no
N/A
yes
N/A
yes
N/A
Temperature Cycling
no
yes
Constant Acceleration
no
yes
Interim Electrical
no
N/A
no
N/A
yes
N/A
Burn-in
no
N/A
no
N/A
yes
N/A
Post Burn-in Electrical
no
N/A
no
N/A
yes
N/A
Steady State Life
no
N/A
no
N/A
yes
N/A
Voltage Conditioning Aging
N/A
no
N/A
no
N/A
yes
Visual Inspection
no
N/A
no
N/A
yes
Final Electrical
no
yes
Wire Bond Evaluation4
no
yes
SEM
no
N/A
no
N/A
yes
N/A
SLAM/C-SAM:
Input capacitors only
(Add’l test, not req. by H or K)
no
yes
no
yes
Notes:
1. Non-QML products do not meet all of the requirements of MIL-PRF-38534.
2. M/S = Active components (Microcircuit and Semiconductor Die)
3. P = Passive components
4. Not applicable to EMI filters that have no wirebonds.
Definitions:
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534
SEM: Scanning Electron Microscopy
SLAM: Scanning Laser Acoustic Microscopy
C-SAM: C - Mode Scanning Acoustic Microscopy
Crane Aerospace & Electronics Power Solutions
sLH single and dual dc/dc converters
28 VoLt input – 1.5 Watt
Page 8 of 10
www.interpoint.com
Rev C - 20090331
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