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參數(shù)資料
| 型號(hào)： | 5962-9157803QJA |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | ADC |
| 英文描述： | 1-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, CDIP24 |
| 封裝： | CERDIP-24 |
| 文件頁數(shù)： | 1/10頁 |
| 文件大?。?/td> | 83K |
| 代理商： | 5962-9157803QJA |
Original Creation Date: 09/26/95
Last Update Date: 12/10/96
Last Major Revision Date: 12/10/96
MNADC1251CM-X REV 2A0
MILITARY DATA SHEET
SELF-CALIBRATING 12-BIT PLUS SIGN A/D CONVERTER WITH
SAMPLE-AND-HOLD
General Description
The ADC1251 is a CMOS 12-bit plus sign successive approximation analog-to-digital
converter. On request, the ADC1251 goes through a self-calibration cycle that adjusts for
any zero, full scale, or linearity errors. The ADC1251 also has the ability to go through
an Auto-Zero cycle that corrects the zero error during every conversion.
The analog input to the ADC1251 is tracked and held by the internal circuitry, so an
external sample-and-hold is not required. The ADC1251 has an S/H control input which
directly controls the track-and-hold state of the A/D. A unipolar analog input voltage
range (0 to +5V) or a bipolar range (-5V to +5V) can be accommodated with +5V supplies.
The 13-bit data result is available on the eight outputs of the ADC1251 in two bytes,
high-byte first and sign extended. The digital inputs and outputs are compatible with TTL
or CMOS logic levels.
NS Part Numbers
ADC1251CMJ-QML
Industry Part Number
ADC1251CM
Prime Die
ADC1251CM
Controlling Document
5962-9157803QJA
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
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