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| 型號(hào)： | 5082-7340 |
| 英文描述： | Hexadecimal and Numeric Indicators(十六進(jìn)制和數(shù)字指示器) |
| 中文描述： | 十六進(jìn)制的數(shù)值指標(biāo)（十六進(jìn)制和數(shù)字指示器） |
| 文件頁(yè)數(shù)： | 2/2頁(yè) |
| 文件大?。?/td> | 34K |
| 代理商： | 5082-7340 |
www.semiconductor.agilent.com
Data subject to change.
Copyright 2000 Agilent Technologies, Inc.
Obsoletes 5964-9632E
5968-9715E (1/00)
Example of Failure Rate Calculation
Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is:
(8 hours/day) x (5 days/week) / (168 hours/week) = 0.25
The point failure rate per year (8760 hours) at 50
°
C ambient temperature is:
(0.037% / 1K hours) x (0.25) x (8760 hours/year) = 0.081% per year
Similarly, 90% confidence level failure rate per year at 50
°
C:
(0.085% / 1K hours) x (0.25) x (8760 hours/year) = 0.186% per year
Notes:
[1] The point typical MTBF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the
case of zero failures, one failure is assumed for this calculation.
[2] The 90% Confidence MTBF represents the minimum level of reliability performance which is expected from 90% of all samples. This
confidence interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This
particular distribution is commonly used in describing useful life failures. Refer to MIL-STD-690B for details on this methodology.
[3] A failure is any LED which does not emit light or the display’s inability to transmit information.
Point Typical
Performance in Time
[1]
(60% Confidence)
Performance
in Time
[2]
(90% Confidence)
Ambient
Temperature (
°
C)
J unction
Temperature (
°
C)
Failure Rate
(%/1K Hours)
Failure Rate
(%/1K Hours)
MTBF
[1]
MTBF
[2]
100
90
80
70
60
50
40
30
20
140
130
120
110
100
90
80
70
60
514,000
694,000
951,000
1,324,000
1,878,000
2,714,000
4,007,000
6,050,000
9,365,000
0.195
0.144
0.105
0.076
0.053
0.037
0.025
0.017
0.011
223,000
301,000
413,000
575,000
816,000
1,179,000
1,740,000
2,628,000
4,067,000
0.448
0.332
0.242
0.174
0.123
0.085
0.057
0.038
0.025
Table 2. Reliability Predictions
Notes:
[4] Failures after 20 temperature cycles are considered Infant Failures. Corrective action is required and has been
implemented for all infant failures.
Table 3. Environmental Tests
MIL-STD-883C
Reference
Units
Tested
Units
Failed
Test Name
Test Conditions
Temperature Cycle
1010
-40 to +100
°
C, 15 minute dwell and
5 minute transfer, 500 cycles
T
A
= +85
°
C, RH = 85%
V
CC
= 5.0 Volts
260
°
±
5
°
C, dwell time = 5 seconds, 2 times.
926
12
(4)
Temperature/
Humidity Op Life
Solder Heat Resistance
–
515
16
2003
1916
0
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