參數(shù)資料
型號: 5082-3001
英文描述: PIN Diodes(PIN二極管)
中文描述: PIN二極管密碼(PIN二極管)
文件頁數(shù): 1/2頁
文件大?。?/td> 17K
代理商: 5082-3001
PIN Diodes
Reliability Data
Description
For applications requiring compo-
nent reliability estimation,
Hewlett-Packard provides
reliability data for all families of
devices. Data is initially compiled
from reliability tests run prior to
market introduction to demon-
strate that a product meets design
criteria. Additional tests are run
periodically. The data on this
sheet represents the latest review
of accumulated test results.
Applications
This information represents the
capabilities of the generic device.
Failure rates and MTTF values
presented here are achievable
with normal MIL-S-19500 TX level
screening. This reliability screen-
ing is no longer available from
Hewlett-Packard. The screening
tests, references, conditions, lot
sizes, and LTPD are provided as
references only.
1N5719
5082-3001
5082-3039
5082-3077
400
J
j
°
C
MEAN TIME TO FAILURE, MTTF (HRS)
Mean Time to Failure vs. J unction Temperature
350
300
250
200
150
100
50
25
10
2
10
3
10
4
10
5
10
6
10
7
10
8
10
9
E
A
= 1.3 eV
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