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參數(shù)資料
| 型號(hào)： | 2214SERIES |
| 元件分類： | SRAM |
| 英文描述： | 64K Nonvolatile SRAM |
| 中文描述： | 20 - TAP在雙酯延遲線運(yùn)輸署/訓(xùn)練班\u003d 10 |
| 文件頁(yè)數(shù)： | 3/3頁(yè) |
| 文件大小： | 51K |
| 代理商： | 2214SERIES |
2214
Doc #97026
2/7/97
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
3
PASSIVE DELAY LINE TEST SPECIFICATIONS
TEST CONDITIONS
INPUT:
Ambient Temperature:
Input Pulse:
OUTPUT:
R
load
:
C
load
:
Threshold:
25
o
C
±
3
o
C
High = 3.0V typical
Low = 0.0V typical
50
Max.
3.0 ns Max. (measured
at 10% and 90% levels)
10M
10pf
50% (Rising & Falling)
Source Impedance:
Rise/Fall Time:
Pulse Width (T
D
<= 75ns):
PW
IN
= 100ns
Period
(T
D
<= 75ns):
PER
IN
= 1000ns
Pulse Width (T
D
> 75ns):
Period
(T
D
> 75ns):
PW
IN
= 2 x T
D
PER
IN
= 10 x T
D
NOTE:
The above conditions are for test only and do not in any way restrict the operation of the device.
Timing Diagram For Testing
T
RISE
T
FALL
PER
IN
PW
IN
T
RISE
T
FALL
10%
10%
90%
50%
10%
90%
10%
V
IH
V
IL
V
OH
V
OL
INPUT
SIGNAL
OUTPUT
SIGNAL
T
RISE
T
FALL
50%
IN
T1
OUT
TRIG
IN
TRIG
Test Setup
DEVICE UNDER
TEST (DUT)
OSCILLOSCOPE
PULSE
GENERATOR
50
R
OUT
R
IN
R
IN
= R
OUT
= Z
LINE
T20
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|---|---|
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