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參數資料
| 型號： | 1114RFREQ3AE |
| 廠商： | VECTRON INTERNATIONAL |
| 元件分類： | XO, clock |
| 英文描述： | CRYSTAL OSCILLATOR, CLOCK, 24 MHz - 100 MHz, TTL OUTPUT |
| 封裝： | LCC-40 |
| 文件頁數： | 16/19頁 |
| 文件大?。?/td> | 1082K |
| 代理商： | 1114RFREQ3AE |
SIZE
CODE IDENT NO.
UNSPECIFIED TOLERANCES
DWG NO.
REV.
SHEET
A
00136
N/A
OS-68338
I
6
advise by purchase order text if this may be an acceptable option to exercise as it assists in
Production Test planning.
4.3.5 Operating Characteristics. Symmetrical square wave limits are dependent on the device
frequency and are in accordance with Tables 2 and 2A. Waveform measurement points and
logic limits are in accordance with MIL-PRF-55310. Start-up time is 10.0 msec. maximum.
4.3.6 Output Load. Standard TTL (6 or 10) and ACMOS (10k, 15pF) test loads are in accordance
with MIL-PRF-55310.
5.
QUALITY ASSURANCE PROVISIONS AND VERIFICATION
5.1
Verification and Test. Device lots shall be tested prior to delivery in accordance with the
applicable Screening Option letter as stated by the 15th character of the part number. Table 5
tests are conducted in the order shown and annotated on the appropriate process travelers and
data sheets of the governing test procedure. For devices that require Screening Options that
include MIL-PRF-55310 Group A testing, the Post-Burn-In Electrical Test and the Group A
Electrical Test are combined into one operation.
5.1.1 Screening Options. The Screening Options, by letter, are summarized as:
A
Modified MIL-PRF-38534 Class K
B
Modified MIL-PRF-55310 Class B Screening & Group A Quality Conformance
Inspection (QCI)
C
Modified MIL-PRF-55310 Class S Screening & Group A QCI
D
Modified MIL-PRF-38534 Class K with Burn-in Delta Aging
E
Modified MIL-PRF-55310 Class B Screening, Groups A & B QCI
F
MIL-PRF-55310 Class S Screening, Groups A & B QCI
G
MIL-PRF-55310 Class B Screening & Post Burn-in Nominal Electricals
X
Engineering Model (EM)
5.2
Optional Design, Test and Data Parameters. The following is a list of design, assembly,
inspection and test options that can be selected or added by purchase order request.
a. Design Pedigree (choose one as the 5th character in the part number):
(R) Hi-Rel design w/ 100krad Class S die, Premium Q Swept Quartz
(V) Hi-Rel design w/ 100krad Class S die, Cultured Quartz
(X) Hi-Rel design w/ Cultured Quartz, Class S die
(B) Hi-Rel design w/ Swept Quartz, Class B die
(C) Hi-Rel design w/ Cultured Quartz, Class B die
(D) Hi-Rel design w/ Cultured Quartz and commercial grade components
b. Input Voltage, (A) for 5.0V, (B) for 3.3V as the 14th character
c. Frequency-Temperature Slew Test
d. Radiographic Inspection
e. Group C Inspection: MIL-PRF-55310 (requires 8 pc. sample)
f. Group C Inspection: MIL-PRF-38534 (requires 8 pc. sample – 5 pc. Life, 3 pc. RGA)
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| 1101RFREQ1AF | CRYSTAL OSCILLATOR, CLOCK, 0.35 MHz - 12 MHz, ACMOS OUTPUT |
| 1101VFREQ2AD | CRYSTAL OSCILLATOR, CLOCK, 12 MHz - 100 MHz, ACMOS OUTPUT |
| 1101VFREQ2AG | CRYSTAL OSCILLATOR, CLOCK, 12 MHz - 100 MHz, ACMOS OUTPUT |
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